Directional Multi-Wavelength Inspection Imaging for Surface Defects
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Solution Overview
Problem
Current inspection systems for devices like jet engines face challenges in detecting wear and tear due to uniform diffuse lighting, which reduces the probability of identifying cracks and other surface anomalies, and difficulty in discerning surface contours under 'flat illumination'.
Innovation Solution
Employing a lighting system with offset directional light sources emitting different wavelengths around a central axis, creating varying illumination angles and shadows to enhance contrast in images, and using a post-processing system to analyze these images for anomaly detection.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Area of stationary object
If uniform diffuse lighting is used to illuminate the surface, then the illumination coverage is improved, but the ability to detect surface anomalies and contours deteriorates
Solution Approach 1:
The lighting system is segmented into multiple discrete light sources positioned at different locations around the inspection camera. Each light source illuminates the surface from a different angle, creating segmented illumination patterns that collectively cover the entire surface area while providing varied lighting perspectives for enhanced anomaly detection
Solution Approach 2:
The patent transitions from single-direction or diffuse lighting to multi-directional lighting by positioning light sources at different angular positions around the camera axis. This adds the dimension of angular variation, allowing the system to capture surface features from multiple perspectives simultaneously, thereby improving both coverage and detection capability
2Measurement precision
If offset directional light sources emitting different wavelengths are used, then the image contrast and anomaly detection capability are improved, but the device complexity increases
Solution Approach 1:
The inspection system is designed with multi-functional capabilities by integrating multiple wavelengths of light (visible and infrared) into a single inspection platform. The same camera and processing system handle both visible and infrared imagery, allowing one device to perform multiple inspection functions and reducing overall system complexity despite the added lighting capabilities
Solution Approach 2:
The patent combines multiple light sources emitting different wavelengths (visible and infrared) into a unified lighting array positioned around the camera. These light sources are merged into a single integrated system that operates simultaneously, eliminating the need for separate inspection systems for different wavelength ranges and simplifying the overall device architecture
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The system significantly improves the ability to detect minute surface variations and defects by enhancing image contrast and resolution, enabling better identification of abnormalities through directional lighting and simultaneous wavelength illumination.
Implementation Method 1
a plurality of light sources collocated with the inspection camera, each configured to output directional light onto a surface of interest, the directional light from each of the plurality of light sources having a different respective range of light wavelengths
Data Source
AI summary
An inspection system and related methods are provided. The inspection system includes an inspection camera, a plurality of light sources collocated with the inspection camera, and a post processing system. The plurality of light sources output directional light that have different respective ranges of light wavelengths. The inspection camera is configured to capture image data while a surface of interest is being illuminated with the directional light. Further, the post processing system is configured to receive the image data, process portions of the image data into a plurality of images that include distinct images corresponding to the different respective ranges of light wavelengths. The plurality of images can be reviewed to identify an abnormal region of the surface of interest.