Discontinuous Anti-Reflective Coating for Wafer Bow Reduction
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Solution Overview
Problem
The application of anti-reflective coatings on both sides of a cap wafer in MEMS devices induces internal stress, causing wafer bow, which interferes with processing steps and hermetic sealing in vacuum packaging.
Innovation Solution
A discontinuous anti-reflective coating is applied to the planar side of the cap wafer, with selective coating in recessed regions on the cavity side, using a shadow mask to reduce internal stress and minimize wafer bow.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Illumination intensity
If anti-reflective coatings are applied on both sides of the cap wafer, then optical performance is improved, but internal stress increases causing wafer bow
Solution Approach 1:
The patent applies anti-reflective coatings selectively only in the recessed regions of the cap wafer rather than uniformly across the entire surface. This localized coating approach maintains the optical performance benefits where needed (in the recesses) while minimizing the total coated area, thereby reducing internal stress and preventing wafer bow.
2Area of stationary object
If continuous anti-reflective coating is applied, then optical coverage is improved, but manufacturing complexity increases due to wafer bow interference
Solution Approach 1:
The patent segments the anti-reflective coating into discrete regions corresponding to the recessed areas of the cap wafer. Instead of applying a continuous coating across the entire wafer surface, the coating is applied only in segmented recessed regions, which eliminates wafer bow and simplifies subsequent processing steps while still providing adequate optical coverage in the critical areas.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The method effectively reduces wafer bow to less than 30 microns, ensuring proper alignment, uniform polishing, and enhanced thermal contact, thereby improving the reliability of the hermetic sealing process.
Implementation Method 1
A discontinuous anti-reflective coating is applied to the planar side of the cap wafer, with selective coating in recessed regions on the cavity side, using a shadow mask to reduce internal stress
Data Source
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AI summary
Methods for reducing wafer bow induced by an anti -reflective coating of a cap wafer are provided. The method may utilize a shadow mask having at least one opening therein that is positioned opposite recessed regions in a cap wafer. The method may further include depositing at least one layer of an anti-reflective coating material through the shadow mask onto a planar side of a cap wafer to provide a discontinuous coating on the planar side.