Discontinuous Solder Mask Opening for Reliable Semiconductor Bonding

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Solution Overview

Problem

The semiconductor packaging process often results in incomplete solder contacts due to defects, leading to packaging issues when attempting to omit solder balls, which can cause unintended consequences.

Innovation Solution

A bond site with a discontinuous profile is created on a packaging substrate, featuring a substrate, solder mask, contact, and metal layers, allowing for unobstructed access and promoting metallic bonding between solder balls and semiconductor chips without interference from the solder mask.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Ease of manufacture

If a continuous opening profile is used in the solder mask, then the manufacturing process is simpler, but the solder mask may interfere with or obstruct the bonding between solder balls and the substrate contact

Engineering Contradiction:
Improvesolder mask fabrication simplicityVSAvoidsolder bond reliability
Core Design Contradiction:
Ease of manufactureVSReliability

Solution Approach 1:

The opening in the solder mask is divided into a first portion and a second portion that are discontinuous or separated. The first portion allows access to the solder ball while the second portion provides access to the substrate contact, preventing the solder mask from obstructing the bonding process while maintaining manufacturing feasibility

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The solder mask opening has different profiles at different locations: the first portion has specific dimensions and shape optimized for solder ball access, while the second portion is optimized for substrate contact access. This local differentiation ensures optimal bonding conditions at each interface without requiring a completely different mask design

Inventive Principle:
Principle #3Local quality

2Reliability

If solder balls are omitted from one component to avoid defects, then incomplete solder contacts are reduced, but unintended consequences and subsequent packaging problems occur

Engineering Contradiction:
Improvesolder contact completenessVSAvoidpackaging problems from omitted solder balls
Core Design Contradiction:
ReliabilityVSObject-generated harmful factors

Solution Approach 1:

The discontinuous opening profile in the solder mask acts as an intermediary structure that facilitates reliable solder bonding without requiring the omission of solder balls. By optimizing the opening geometry, the invention enables complete and defect-free solder contacts to form, eliminating the need to remove solder balls and avoiding the packaging problems that result from such omissions

Inventive Principle:
Principle #24Intermediary (Mediator)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

This solution enables reliable solder bond formation between semiconductor chips and packaging substrates, reducing defects and subsequent packaging problems by ensuring unobstructed contact and promoting metallic bonding.

Implementation Method 1

A subsequent heating step may be performed to assist with forming a solder contact between the two components

Methodology Applied
Scientific EffectMelting: Melting

Implementation Method 2

The metallic connection locations may have a solder ball formed thereon to provide a bonding location for a solder ball of a semiconductor chip. The solder may be used to form a low temperature electrical connection between the semiconductor chip and the metallic traces on the substrate

Methodology Applied
Scientific EffectElectrical conduction: Conduction (electrical)

Data Source

PatentUS10847382B2Solder bond site including an opening with discontinuous profile
Publication Date: 2020.11.24 MICRON TECHNOLOGY INC
  • US10847382B2 patent drawing
  • US10847382B2 patent drawing
  • US10847382B2 patent drawing

AI summary

Apparatuses and methods for formation of a bond site including an opening with a discontinuous profile are disclosed herein. An example apparatus may at least include a substrate, a contact on the substrate, and a mask layer formed on the substrate and at least a portion of the contact. The mask layer may also include an opening formed therein, with the opening having a discontinuous profile from a top surface of the mask layer to the contact.