Disk Protrusion Detection Circuit with Parallel Signal Processing
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Solution Overview
Problem
Current disk protrusion detection and flatness measurement systems require switching between signal processing circuits, leading to reduced test efficiency and increased circuit size due to the need for separate systems for protrusion detection and average value calculation.
Innovation Solution
A disk protrusion detection/flatness measurement circuit that integrates a protrusion detection sensor, amplifier circuit, A/D conversion circuit, and data processing circuit, allowing for simultaneous signal amplification, conversion, band-pass filtering, peak detection, and average value calculation without external switching, thereby eliminating the need for separate processing circuits.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If separate signal processing circuits are used for protrusion detection and average value calculation, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The patent merges the protrusion detection circuit and the average value calculation circuit into a single integrated circuit. The signal processing unit performs both peak detection (for protrusion detection) and average value calculation simultaneously, eliminating the need for separate circuits. This reduces device complexity while maintaining measurement precision through unified signal processing.
Solution Approach 2:
The signal processing unit is designed with multi-functionality to handle both protrusion detection and flatness measurement tasks. By incorporating both peak detection and average value calculation capabilities within the same circuit, the system achieves universal functionality without requiring separate specialized circuits, thereby reducing overall device complexity.
2Measurement precision
If separate signal processing circuits are used for protrusion detection and average value calculation, then measurement precision is improved, but productivity decreases
Solution Approach 1:
The integrated circuit enables continuous processing of disk surface data by performing both protrusion detection and average value calculation in a unified signal processing pipeline. This eliminates the need to switch between separate circuits, allowing continuous measurement operations and improving test efficiency without compromising measurement precision.
3Measurement precision
If separate signal processing circuits are used for protrusion detection and average value calculation, then measurement precision is improved, but loss of time increases
Solution Approach 1:
By merging the protrusion detection and average value calculation functions into a single integrated circuit, the patent eliminates the time required to switch between separate circuits. The unified signal processing unit processes both measurement types simultaneously, removing switching delays and improving overall measurement speed while maintaining precision.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This integrated approach enables efficient protrusion detection and flatness measurement without switching circuits, reducing the size of the measurement circuit and improving test efficiency by performing peak detection and average value calculation in parallel within the data processing circuit.
Implementation Method 1
The protrusion testing device includes a piezoelectric sensor (piezoelectric element) as a protrusion detection sensor on the upper side of a slider of a thin film head. The vibration generated when the slider collides with a protrusion on the disk is converted to an electrical signal by the protrusion detection sensor.
Implementation Method 2
an amplifier circuit that amplifies a signal from the protrusion detection sensor
Data Source
AI summary
The present invention relates to a disk protrusion detection/flatness measurement circuit and a disk glide tester, in which protrusion detection and average value calculation can be performed without switching signal processing circuits of two systems, one for the protrusion detection of a disk and the other for the average value calculation with respect to a track or a sector of the disk. This also makes it possible to reduce the size of the measurement circuit. In the protrusion detection/flatness measurement circuit, a signal from a protrusion detection sensor is amplified and converted from an analog signal to a digital signal. The signal passes through a band-pass filter to obtain a digital signal with a predetermined bandwidth. Then, peak detection and average value calculation processes are applied in parallel to the obtained digital signal. Thus, pass/fail decision of the disk can be made based on the detected peak and average values.