Display Brightness Adjustment via Virtual Capacitance Simulation

The patent creates a virtual model (copy) of the actual pixel structure with complex bump or slit structures, rather than using a simple test cell. This virtual model replicates the electrical characteristics of the real pixel, allowing accurate capacitance measurement that accounts for the complex geometry without requiring physical fabrication of test structures.

The patent changes the measurement approach from direct physical measurement of simple test cells to computational extraction of capacitance parameters from T-V and C-V curves obtained through brightness adjustment measurements. This parameter transformation allows the measurement system to account for complex pixel structures through mathematical modeling rather than physical simplification.

The patent implements a feedback mechanism where brightness adjustment measurements are performed on the actual display device, the T-V and C-V curves are extracted, and these measurements feed back to determine accurate liquid crystal capacitance values. This closed-loop approach ensures the capacitance values used in simulation are accurate representations of the actual liquid crystal material in the complex pixel structure.

The patent introduces T-V (transparency versus voltage) and C-V (capacitance versus voltage) curves as intermediary elements that bridge the gap between simple brightness measurements and accurate capacitance determination. These curves serve as mediators that translate easily obtainable brightness data into precise capacitance values without requiring direct complex measurements.