Display Cathode Test Pattern for Early Short-Circuit Detection
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Solution Overview
Problem
Display devices with inorganic light-emitting elements face challenges in detecting cathode short circuits due to cathode residual films, which can lead to performance issues.
Innovation Solution
Incorporation of a test element group (TEG) structure as a test pattern in a dummy region to monitor cathode short circuits through resistance measurement between adjacent cathode patterns.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a test element group (TEG) structure is added to monitor cathode short circuits, then detection capability is improved, but device complexity increases
Solution Approach 1:
The patent divides the monitoring function into separate test element groups (TEGs) positioned in different regions (first TEG in front of light-emitting elements, second TEG behind light-emitting elements). This segmentation allows independent measurement of cathode short circuits at different locations, improving detection capability while keeping each individual TEG structure relatively simple.
Solution Approach 2:
The patent introduces test element groups as intermediary structures that mediate between the cathode patterns and measurement equipment. These TEGs include test cathode patterns and test anode patterns that serve as intermediaries to detect cathode short circuits without requiring direct modification of the main light-emitting structure, thus improving detection while maintaining structural integrity.
2Measurement precision
If resistance measurement is performed between adjacent cathode patterns, then measurement precision is improved, but manufacturing precision requirements increase
Solution Approach 1:
The test element groups use disposable test cathode patterns and test anode patterns that are specifically designed for measurement purposes. These test structures can be manufactured with standard precision tolerances and used for detection without requiring ultra-precise manufacturing, as they serve a single measurement function rather than dual measurement and light-emitting functions.
Solution Approach 2:
The patent measures resistance between adjacent cathode patterns in the test element groups, which are positioned in dimensions separate from the main light-emitting element array. By creating test structures in a separate measurement dimension (the TEG region), the patent reduces the impact of manufacturing variations on measurement accuracy, as the test patterns can be optimized independently for measurement purposes.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
Enables early detection of cathode short circuits, ensuring reliable operation and performance of inorganic light-emitting display devices.
Implementation Method 1
monitoring a cathode short circuit in advance through resistance measurement between adjacent cathode patterns
Data Source
AI summary
A display device and a test method of the display device are discussed. The display device can include a substrate having a display region and a non-display region, a circuit layer disposed in the display region and the non-display region, a plurality of banks disposed on the circuit layer, and a plurality of pixels each including a plurality of light-emitting elements disposed on the plurality of banks in the display region. The first electrodes of the plurality of pixels are connected to the anode electrodes of the plurality of light-emitting elements, and the second electrodes of the plurality of pixels are connected to the cathode electrodes of the plurality of light-emitting elements. Adjacent second electrodes of the pixels are disposed to face each other and are spaced apart from each other.