Display Cell Inspection System for Drive Reliability Testing

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Current inspection systems for display cells lack an efficient method to perform driver reliability tests, which is crucial for ensuring the quality and longevity of OLED devices, leading to increased manufacturing costs and complexity.

Innovation Solution

An inspection system and method that utilize an array test part and a lighting test part to control data signals for display cells, specifically blocking signals during white and black image displays to perform a drive reliability test, simplifying the inspection process and reducing costs.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If separate inspection systems are used for array test and lighting test, then measurement precision is improved, but device complexity increases

Engineering Contradiction:
Improveinspection accuracyVSAvoidsystem complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent combines the array test part and lighting test part into a single integrated inspection system. The controller coordinates both test functions using shared hardware resources (display cell, data lines, transistors), eliminating the need for separate inspection systems while maintaining the precision of both test types through unified control architecture.

Inventive Principle:
Principle #5Merging (Combining)

2Productivity

If both array test and lighting test are performed simultaneously, then productivity is improved, but device complexity increases

Engineering Contradiction:
Improveinspection efficiencyVSAvoidcontrol complexity
Core Design Contradiction:
ProductivityVSDevice complexity

Solution Approach 1:

The patent implements periodic action by alternating between array test mode and lighting test mode within a single inspection cycle. The controller switches between providing array control signals and lighting control signals at different time periods, enabling both tests to be performed sequentially in an integrated system without requiring simultaneous complex coordination.

Inventive Principle:
Principle #19Periodic action

Solution Approach 2:

The inspection system employs dynamic control where the controller can switch between different test modes (array test, lighting test, drive reliability test) based on inspection requirements. The system adapts its signal providing behavior dynamically, adjusting which test part receives control signals at any given moment, thereby managing complexity while maintaining productivity.

Inventive Principle:
Principle #15Dynamics

3Ease of operation

If drive reliability test is performed without signal blocking, then ease of operation is improved, but reliability measurement accuracy deteriorates

Engineering Contradiction:
Improvetest operation simplicityVSAvoidreliability test accuracy
Core Design Contradiction:
Ease of operationVSMeasurement precision

Solution Approach 1:

The patent applies preliminary anti-action by implementing signal blocking mechanisms before interference can occur during drive reliability testing. The controller proactively blocks array data signals during white image display periods and blocks lighting data signals during black image display periods, preventing unwanted signals from affecting the reliability test measurements before the problem can arise.

Inventive Principle:
Principle #9Preliminary anti-action

Data Source

PatentUS11087653B2Inspection system and method of inspecting a display cell using the same
Publication Date: 2021.08.10 SAMSUNG DISPLAY CO LTD
  • US11087653B2 patent drawing
  • US11087653B2 patent drawing
  • US11087653B2 patent drawing

AI summary

An inspection system for a display cell having a display part and a plurality of data lines connected to first and second pixel units of the display part. An array test part and a lighting test part are located in a peripheral area around the display part. An inspection apparatus is configured to provide the array test part with an array control signal to block an array data signal from being applied to a plurality of data lines in a period in which a white image is displayed and to provide the lighting test part with a lighting control signal to block a lighting data signal from being applied to a plurality of data lines during a period in which a black image is displayed, during a drive reliability test mode for displaying a test image including the black image and the white image.