Display Cell Test Circuit for Private Pixel Viewing-Angle Checks
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing display cell testing methods do not effectively test the private mode functionality, which requires independent illumination of private pixels with different viewing angles, leading to inefficiencies in identifying defects.
Innovation Solution
A display cell design with a test circuit that allows independent application of light-off and light-on voltages to normal and private sub-pixels, enabling a private mode test by distinguishing between normal and private viewing angles.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If existing display cell testing methods are used, then general functionality is tested, but private mode functionality cannot be effectively tested
Solution Approach 1:
The display cell is segmented into normal pixels and private pixels with distinct viewing angles. The test circuit independently controls normal sub-pixels and private sub-pixels through separate data lines, enabling independent testing of private mode functionality without interference from normal pixel operations.
Solution Approach 2:
Different regions of the display cell are assigned different functional qualities: normal pixels for general display and private pixels for private mode display with restricted viewing angles. The test circuit applies different testing protocols and voltage signals to different pixel types, ensuring accurate detection of private mode-specific defects.
2Adaptability or versatility
If independent control of private and normal sub-pixels is implemented, then private mode testing is enabled, but device complexity increases
Solution Approach 1:
The test circuit is designed with multi-functionality to handle both normal pixel testing and private pixel testing through a unified architecture. The same test circuit can selectively apply light-off voltages and light-on voltages to different pixel types based on testing requirements, reducing the need for entirely separate testing systems.
Solution Approach 2:
The patent introduces intermediate control structures including first and second transistors that act as mediators between the test circuit and the pixels. These transistors selectively connect data lines to either normal sub-pixels or private sub-pixels based on control signals, enabling independent control without requiring completely separate wiring for each pixel type.
3Ease of operation
If separate data lines are used for normal and private sub-pixels, then independent voltage application is achieved, but manufacturing complexity increases
Solution Approach 1:
The patent merges the control of normal and private sub-pixels into a unified data line structure where the same physical data line can be selectively connected to different pixel types through transistor switching. This approach maintains the independence of voltage application while avoiding the need for completely separate data line routing for each pixel type, thereby simplifying manufacturing.
Data Source
AI summary
A display cell includes a display area including a normal pixel which includes first to fourth normal sub-pixels and has a normal viewing angle, and a private pixel which includes first to fourth private sub-pixels and has a private viewing angle different from the normal viewing angle, and an test circuit configured to test a private mode in which only the private pixel is illuminated by providing a light-off voltage and a light-on voltage to the normal pixel and the private pixel. The test circuit provides the light-on voltage to at least one of the first to fourth private sub-pixels independently from the first to fourth normal sub-pixels.