Display Device Chip Mount Area Static Electricity Protection
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Solution Overview
Problem
Static electricity generated during the manufacturing process of display devices can damage lighting test thin film transistors, preventing normal lighting tests from being performed.
Innovation Solution
The display device incorporates a chip mount area with a lighting test transistor unit and data output pad unit, where the resistances of connecting lines are balanced, and ground lines with high resistance (500 KΩ to 1 MΩ) are used to dissipate static electricity, protecting the lighting test transistor from electrostatic discharge.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the lighting test transistor is directly connected to data output pads through connecting lines, then the lighting test signal can be transmitted to pixels, but static electricity generated during manufacturing can damage the lighting test transistor
Solution Approach 1:
The patent applies equipotentiality by connecting multiple data output pads to ground through ground lines with equal resistance values. This creates equal potential distribution across all data output pads, ensuring that static electricity generated during manufacturing processes is evenly distributed and safely dissipated to ground, preventing damage to the lighting test transistor while maintaining proper signal transmission functionality
2Reliability
If ground lines with high resistance (500 KΩ to 1 MΩ) are used to dissipate static electricity, then the lighting test transistor is protected from electrostatic discharge, but the resistance of connecting lines increases
Solution Approach 1:
The patent applies local quality by differentiating the resistance characteristics of different line types within the same circuit. Data output pad connecting lines maintain low resistance for optimal signal transmission, while ground lines are specifically designed with high resistance (500 KΩ to 1 MΩ) to safely dissipate static electricity. This localized differentiation of electrical properties allows simultaneous optimization of both signal integrity and electrostatic protection
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This configuration effectively prevents damage to the lighting test transistor by balancing electrostatic current distribution and ensuring safe discharge, allowing for reliable lighting tests and device manufacturing.
Implementation Method 1
ground lines with high resistance (500 KΩ to 1 MΩ) are used to dissipate static electricity
Implementation Method 2
Each of resistances of the plurality of ground lines may be 500 KΩ to 1 MΩ
Data Source
AI summary
A display device includes a substrate having a display area and a non-display area. A plurality of pixels is disposed in the display area. A chip mount area is disposed on the non-display area. The chip mount area includes a data output pad unit, a lighting test transistor unit and a plurality of lines connecting the data output pad unit and the lighting test transistor unit. The lighting test transistor unit is configured to transfer at least one lighting test signal to the plurality of pixels through the data output pad unit. The resistances of each of the plurality of lines are the same.


