Display Crack Lines for Defect Inspection
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Solution Overview
Problem
Current display device inspection methods fail to reliably detect defects and cracks, particularly in flexible display panels, leading to increased process defect rates and reduced manufacturing reliability.
Innovation Solution
A display device design incorporating a first crack line and a second crack line in the peripheral area, with an insulating layer between them, allows for defect detection using a Wheatstone bridge and Murray loop test, enabling precise identification of defect positions and types.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If conventional inspection methods are used, then the inspection process is simple, but the defect detection reliability is low
Solution Approach 1:
The display layer is segmented to include multiple crack lines (first crack line, second crack line) positioned at different locations and orientations. These segmented conductive paths allow independent detection of defects in different regions, improving overall inspection reliability while maintaining a modular structure that can be integrated into the display manufacturing process
Solution Approach 2:
An insulating layer is introduced as an intermediary between the first crack line and the second crack line. This insulating layer prevents electrical interference between the two crack lines while allowing each to function as an independent detection path, thereby improving defect detection reliability without causing false readings from electrical coupling
2Measurement precision
If multiple crack lines are added to improve detection accuracy, then the measurement precision increases, but the manufacturing complexity increases
Solution Approach 1:
The crack line system is segmented into multiple independent conductive paths (first crack line, second crack line) that can be manufactured separately and then integrated. This segmentation allows each crack line to be optimized for specific detection purposes while simplifying the overall manufacturing process through modular construction
Solution Approach 2:
The second crack line is positioned to overlap with the first crack line in plan view, creating a redundant detection path. This copying approach allows the same detection methodology to be applied at multiple locations, improving measurement precision while using identical manufacturing processes for each crack line
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This approach enhances defect inspection reliability, allowing for accurate detection and analysis of defects, reducing process defect rates and improving manufacturing process reliability by identifying and correcting defect sources.
Implementation Method 1
The first crack line is insulated from the second crack line
Implementation Method 2
analyzing a position where the defect occurs based on a Wheatstone bridge
Implementation Method 3
The analyzing of the position of the defect may be performed using a Murray loop test
Data Source
AI summary
A display device includes a display layer including an active area in which a plurality of pixels is arranged and a peripheral area located adjacent to the active area. The display layer includes a transistor disposed in the active area and including a gate, a source, and a drain, a first crack line disposed in the peripheral area and surrounding a portion of the active area in a plan view, and a second crack line disposed in the peripheral area under the first crack line. The first crack line is insulated from the second crack line.