Display Panel Data-Link Defect Detection With Auto-Probe Circuit
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Solution Overview
Problem
Conventional auto-probe test methods are unable to conduct open/short tests for data link lines connecting data pads and data lines in display devices, limiting defect detection capabilities.
Innovation Solution
A display device and method that utilize an auto-probe (AP) test circuit and multiplexer in the non-display area to detect defects in data link lines by applying specific voltage combinations and controlling switching elements to identify dark or bright line patterns on the display panel, indicating short or open defects.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If conventional auto-probe test methods are used, then the test process is simple, but data link line defects cannot be detected
Solution Approach 1:
The existing auto-probe test circuit is enhanced to perform multiple functions: it can detect both traditional substrate defects and data link line defects (open/short conditions) using the same basic circuit architecture. The multiplexer is integrated into the existing test circuit to enable data link line testing without requiring a completely separate test system.
Solution Approach 2:
A multiplexer is introduced as an intermediary component between the data driving circuit and the data lines. This multiplexer enables the test circuit to selectively connect to different data lines and detect link line defects by controlling the switching elements, thereby extending the defect detection capability without fundamentally changing the test circuit architecture.
2Measurement precision
If data link line defects are detected using visual inspection of dark or bright line patterns, then defect detection accuracy is improved, but the testing process becomes more complex
Solution Approach 1:
The invention utilizes visual changes in the display panel (dark or bright line patterns) to indicate the presence of data link line defects. By applying specific voltage combinations through the multiplexer to selected data lines, defective lines manifest as distinct dark or bright patterns that can be easily visually inspected, thereby improving defect detection accuracy through observable visual changes.
3Reliability
If multiple switching elements are controlled to apply specific voltage combinations, then data link line defects can be detected, but the control process becomes more complex
Solution Approach 1:
The testing process employs periodic application of specific voltage combinations through the multiplexer's switching elements. By systematically controlling the switching elements in a structured sequence and applying voltages in periodic patterns, the test circuit can methodically detect data link line defects while maintaining manageable operational complexity through repetitive, standardized testing procedures.
Data Source
AI summary
A display device includes a display panel divided into a display area and a non-display area such that data lines and gate lines are arranged in the display area in an intersecting manner, thereby defining pixels in a matrix, a multiplexer disposed in the non-display area of the display panel at one side of the data lines, an auto-probe (AP) test circuit disposed in the non-display area of the display panel at the other side of the data lines, and a data driver for supplying a data voltage to the data lines of the display panel through the multiplexer. The multiplexer and the AP test circuit may detect a defect of a link line connected to each data line.