Display Defect Detection Using Contour Perimeter Analysis
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Solution Overview
Problem
Existing inspection methods for high pixel-density displays require sensor defect data, which increases test time and system complexity, and cannot accurately distinguish between defects and RTS noise.
Innovation Solution
An inspection apparatus that captures images of display devices with sensor pixels, locates defect candidates, generates contours based on their positions, and determines whether they are defects based on contour perimeters, without using sensor defect data.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If sensor defect data is used for defect detection, then defect detection accuracy is improved, but system complexity and test time increase
Solution Approach 1:
The patent extracts and eliminates the sensor defect data processing component from the inspection system. Instead of using sensor defect data (which requires memory storage and data processing), the invention directly processes captured images through contour generation and perimeter calculation to identify defects, thereby reducing system complexity while maintaining detection accuracy
Solution Approach 2:
The patent creates a simplified inspection model that copies the essential defect detection function without requiring sensor defect data. By generating contours and calculating perimeters directly from captured images, the system achieves the same detection purpose with a simpler, data-free approach
2Measurement precision
If sensor defect data is stored and processed, then defect detection capability is improved, but test time increases
Solution Approach 1:
The patent performs preliminary contour generation and perimeter calculation directly during the image capture process. By pre-processing the captured images to identify defect contours and calculate their perimeters before final defect determination, the system eliminates the need for time-consuming sensor defect data storage and processing steps
Solution Approach 2:
The patent removes the time-consuming sensor defect data acquisition and storage operations from the inspection workflow. The streamlined process directly processes captured images through contour extraction and perimeter measurement, significantly reducing test time while maintaining detection capability
3Measurement precision
If pixel density of camera sensor is increased, then inspection resolution is improved, but difficulty in distinguishing defects from RTS noise increases
Solution Approach 1:
The patent uses contour generation to create curved boundary representations of defect regions. By calculating the perimeter of these contours and comparing it against threshold values, the system can distinguish genuine defects (which have specific perimeter characteristics) from RTS noise (which does not form proper contours), thereby resolving the differentiation difficulty at high pixel densities
Data Source
AI summary
An inspection apparatus for defect detection in a display device having an array of a plurality of pixels, includes a processor; and a memory storing a program which, when executed by the processor, causes the inspection apparatus to: an image acquisition processing to acquire an image of the pixels of the display device with sensor pixel; a locating processing to locate positions of defect candidates of the display device in the image captured by the image acquisition processing; a contour generation processing to generate a contour of the defect candidate of the display device based on the position of the defect candidate of the display device; and a determination processing to determine whether the defect candidate is a defect of the display device based on a perimeter of the contour.