Display Device Leakage Detection via Segmented Source Bus Lines

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Solution Overview

Problem

Conventional display devices with layered wiring structures face challenges in detecting line leakage between source bus lines, as simple testing circuits often fail to detect all types of leakage, particularly between adjacent lines in non-layered and layered regions.

Innovation Solution

A display device with a layered wiring structure that uses two potential supply lines to supply different potentials to odd-numbered and even-numbered video signal lines, allowing for the detection of leakage between adjacent lines in both non-layered and layered regions, and includes a charge elimination circuit to eliminate residual electric charges.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Area of stationary object

If a layered wiring structure is employed to reduce picture-frame size, then the area of the picture-frame is reduced, but the ability to detect leakage between source bus lines deteriorates

Engineering Contradiction:
Improvepicture-frame sizeVSAvoidleakage detection capability
Core Design Contradiction:
Area of stationary objectVSReliability

Solution Approach 1:

The source bus lines are divided into odd-numbered lines and even-numbered lines, with different potential supply circuits assigned to each group. This segmentation allows the testing circuit to apply different potentials to adjacent lines, enabling detection of leakage between them while maintaining the compact layered wiring structure.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

Different potential supply circuits act as intermediaries between the signal source and the source bus lines. These intermediary circuits enable the testing circuit to control the potential of each line independently, facilitating leakage detection without requiring a complex testing circuit architecture that would increase picture-frame size.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Device complexity

If a simple testing circuit is used, then the device complexity is reduced, but the measurement precision of leakage detection deteriorates

Engineering Contradiction:
Improvetesting circuit complexityVSAvoidleakage detection accuracy
Core Design Contradiction:
Device complexityVSMeasurement precision

Solution Approach 1:

The testing circuit is segmented into multiple simple potential supply circuits, each responsible for supplying a specific potential to a group of source bus lines. This segmentation maintains overall circuit simplicity while enabling precise leakage detection through coordinated potential control of different line groups.

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The testing circuit achieves precise leakage detection by changing the potential parameter of different source bus lines through different potential supply circuits. By controlling the potential of odd-numbered and even-numbered lines differently, the simple testing circuit can detect leakage with high precision without requiring complex circuit architecture.

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS10241369B2Display device
Publication Date: 2019.03.26 SHARP KK
  • US10241369B2 patent drawing
  • US10241369B2 patent drawing
  • US10241369B2 patent drawing

AI summary

An object of the present invention is to realize a display device having a layered wiring structure, that is capable of detecting leakage without fail by using a simple testing circuit.Source bus lines (SL) are wired such that, in the layered region, two source bus lines (SL) adjacent in a vertical direction are a combination of a source bus line (SL) of an odd-numbered column and a source bus line (SL) of an even-numbered column, and two source bus lines (SL) adjacent in a horizontal direction are a combination of a source bus line (SL) of an odd-numbered column and a source bus line (SL) of an even-numbered column. Potentials of different magnitudes are supplied respectively to source bus lines (SL) of odd-numbered columns and source bus lines (SL) of even-numbered columns via testing lines.