Display Device Non-Display Area Defect Detection
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Solution Overview
Problem
Existing display devices are unable to effectively detect defects such as fractures and cracks in non-display areas, which can lead to performance issues and moisture penetration, despite defect detection processes focusing on pixel illumination.
Innovation Solution
Incorporation of a test data line, connection line units with disconnection portions, and dummy line units in the non-display area to detect defects by bypassing the disconnection portions and using dummy line units to sense defects, allowing for improved detection of fractures and cracks outside the display area.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a test voltage is applied to each pixel to identify defective pixels, then defective pixels can be detected, but other defects such as fractures and cracks in non-display areas cannot be detected
Solution Approach 1:
The non-display area is segmented into multiple regions, with different dummy line units (first, second, third dummy line units) placed in different regions. This segmentation allows comprehensive coverage of the non-display area for defect detection, addressing the limitation of not detecting fractures and cracks outside pixel regions.
Solution Approach 2:
Dummy line units are introduced as intermediary elements in the non-display area. These dummy line units serve as test structures that do not interfere with normal display operation but enable detection of fractures and cracks. The test voltage is applied through connection line units to these dummy line units, allowing indirect detection of defects in non-display areas.
2Measurement precision
If dummy line units are added to detect defects in non-display areas, then detection capability is improved, but device complexity increases
Solution Approach 1:
The dummy line units are designed to serve multiple functions: they act as test structures for defect detection, are integrated into the existing display device structure, and can be formed using the same manufacturing processes as the display electrode. This multi-functionality reduces the need for separate testing equipment and minimizes additional complexity.
Solution Approach 2:
The dummy line units are merged with the existing display device structure, sharing common elements such as the substrate, insulation layers, and conductive materials. The connection line units that apply test voltage are integrated with the data line structure, reducing the need for separate testing infrastructure and minimizing overall device complexity.
Data Source
AI summary
A display device including a display area and a non-display area surrounding the display area. The non-display area includes a test data line (TDL) which receives a test data signal from an external source, a plurality of connection line units (CLUs) which connect the data lines and the TDL, and a dummy line unit which is formed in the non-display area. Each of the CLUs includes a test switch having an input terminal connected to the TDL, an output terminal connected to one of a plurality of data lines disposed in the display area, and a control terminal connected to a test switch control line which receives a test switch control signal from an external source. At least one of the CLUs includes a disconnection portion which interrupts the TDL, wherein both ends of the disconnection portion are connected to the dummy line unit by bypass connection lines, respectively.