Display Driver Current Measurement for Component Defect Detection
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Solution Overview
Problem
Existing methods for testing display devices are inadequate in determining defects in the driver and display panel components, leading to potential manufacturing errors and subpar device quality.
Innovation Solution
A method involving the measurement of operating currents to assess the functionality of driver and display panel components, including sub-current measurements for specific parts like logic and analog parts, scan blocks, and data output, to determine defectiveness.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a test method is used to determine whether a display device is defective, then the quality of the display device can be improved, but the existing test method is inadequate in determining defects in driver and display panel components
Solution Approach 1:
The patent divides the display device into separate testable components: the driver (including driver chip, scan block, data output part) and the display panel. By segmenting the device and testing each component independently through selective enabling/disabling, the test method achieves precise defect detection for each segment, resolving the inadequacy of existing holistic test methods.
2Ease of manufacture
If operating current measurement is performed for the entire display device, then the test process is simple, but it cannot identify defects in specific components like logic part, analog part, scan block, or data output part
Solution Approach 1:
The patent employs dynamic testing by selectively enabling and disabling specific components (driver chip, scan block, data output part, display panel) during the test process. This dynamic configuration allows the simple current measurement method to be adapted for component-level defect detection, maintaining ease of manufacture while overcoming the limitation of unable to identify specific defective components.
3Productivity
If the display device is tested as a complete unit, then manufacturing time is reduced, but defective components cannot be specifically identified for targeted repair or replacement
Solution Approach 1:
The patent performs preliminary component-level testing by systematically enabling and disabling specific components before final assembly or shipping. This preliminary action identifies defective components early in the manufacturing process, maintaining high productivity while enabling targeted repair or replacement, thus improving ease of repair.
Data Source
AI summary
A method of testing a display device including a display panel which displays an image and a driver which drives the display panel including measuring a driving operating current in a state where the driver is enabled and the display panel is disabled, and determining whether the driver is defective, based on the driving operating current and measuring a display operating current in a state where the driver and the display panel are enabled, and determining whether the display panel is defective, based on the display operating current.