Display Driver IC Test Line Segmentation for Signal Isolation
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Solution Overview
Problem
Current display driver devices lack an individual test for each component, particularly the display driving chip, which affects the reliability and stability of signal transmission characteristics.
Innovation Solution
A display driver device is designed with a timing controller, a display driver integrated circuit, a flexible printed circuit board, connection lines, and test lines, allowing the device to operate in both normal and test modes, with the display driver integrated circuit receiving test signals directly through separate test lines, thereby isolating it from image data in test mode.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a separate test line is added to enable individual component testing, then measurement precision and reliability are improved, but device complexity increases
Solution Approach 1:
The patent divides the signal transmission path into separate channels: a connection line for normal image data transmission and a dedicated test line for test signal transmission. This segmentation allows independent testing of the display driver integrated circuit without interfering with normal operation, thereby improving measurement precision while managing device complexity through functional separation.
Solution Approach 2:
The patent introduces a test mode control unit as an intermediary component that manages the switching between normal mode and test mode. This mediator coordinates the test signal transmission through the test line and controls the isolation of the connection line, enabling precise testing while maintaining systematic control over the increased device complexity.
2Reliability
If the display driver integrated circuit is isolated from image data during testing, then reliability of testing is improved, but device complexity increases due to mode switching mechanisms
Solution Approach 1:
The patent implements dynamic mode switching between normal mode and test mode through a test mode control unit. The display driver integrated circuit can dynamically transition between receiving image data through the connection line and receiving test signals through the test line, ensuring reliable testing conditions while managing complexity through controlled dynamic behavior rather than permanent structural changes.
Solution Approach 2:
The patent applies local quality by creating a specialized test environment specifically for the display driver integrated circuit. The test line provides localized test signal transmission dedicated solely to testing the integrated circuit, while the connection line maintains its normal function. This localized approach ensures testing reliability without requiring complete system restructuring.
3Manufacturing precision
If separate test lines are implemented for each component, then manufacturing precision can be improved, but device complexity and production cost increase
Solution Approach 1:
The patent segments the signaling infrastructure into dedicated test lines and connection lines, enabling precise evaluation of the display driver integrated circuit during manufacturing. This segmentation allows manufacturers to test individual components with high precision while maintaining a manageable level of complexity through clear functional separation and standardized implementation.
Data Source
AI summary
A display driver device includes a timing controller, a display driver integrated circuit, a flexible printed circuit board, a connection line, and a test line. The timing controller includes an output pad unit. The display driver integrated circuit includes an input pad unit. The connection line is formed at the flexible printed circuit board to electrically connect the input pad unit with the output pad unit. The test line is formed at the flexible printed circuit board, and is used to provide a test signal to the input pad unit. The display driver device operates in a normal mode or operates in the test mode based on a test mode signal.