Display Driving Circuit Reset for Gate Line Leakage
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Solution Overview
Problem
Existing display devices face malfunctions when resuming gate line scanning due to potential leakage currents causing unintended switching during touch position detection periods, leading to incorrect scanning of non-selected gate lines.
Innovation Solution
The display device incorporates a driving circuitry with a reset circuit that alternates the potential of internal lines between a first potential higher than the threshold voltage and a second potential lower than the first, ensuring the output switching element remains in the OFF state upon resumption of scanning, using a reset circuit with switching elements and capacitors to manage potential changes effectively.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a potential holding signal at H level is supplied to transistors connected to the internal node during the touch position detection period, then the potential of the internal node that should hold H level can be maintained, but the potential of the internal node that should hold L level may rise due to leakage current
Solution Approach 1:
The invention divides the transistors into two groups: those connected to internal nodes holding H level and those connected to internal nodes holding L level. Different potential holding signals are supplied to each group, allowing differentiated control to prevent leakage current from affecting L-level nodes while maintaining H-level nodes.
Solution Approach 2:
The invention applies different potential holding signals to different transistors based on their specific connection to internal nodes. Transistors connected to H-level internal nodes receive H-level holding signals, while transistors connected to L-level internal nodes receive L-level holding signals, ensuring local optimization of potential maintenance without causing harmful leakage effects.
2Adaptability or versatility
If the scanning of gate lines is suspended during touch position detection period, then touch detection can be performed, but malfunctions occur when scanning is resumed due to potential leakage
Solution Approach 1:
The invention prepares the internal nodes by supplying appropriate potential holding signals before the scanning suspension period begins. This preliminary action ensures that when scanning is resumed, the internal nodes are already in the correct potential state, preventing malfunctions caused by leakage current during the transition.
Solution Approach 2:
The invention counteracts the potential leakage effect before it can cause malfunction by supplying potential holding signals to transistors connected to L-level internal nodes during the touch detection period. This preliminary anti-action prevents the rising of internal node potential that would otherwise occur due to leakage current.
3Stability of the object's composition
If the internal node potential is held at H level during touch detection, then the shift register can maintain its state, but unintended gate line scanning occurs upon resumption
Solution Approach 1:
The invention applies different potential holding strategies to different shift registers based on their internal node states. Shift registers with H-level internal nodes receive H-level holding signals, while shift registers with L-level internal nodes receive L-level holding signals, ensuring that only the intended gate line is scanned upon resumption.
Solution Approach 2:
The invention segments the shift register operation into different potential holding modes based on the current scanning state. During touch detection, the system switches to a mode where L-level internal nodes are actively held, preventing unintended gate line activation while maintaining the stability of H-level nodes.
Data Source
AI summary
The display device includes drive circuits 301 provided in correspondence to the gate lines, respectively, and alternately switches a scanning period for scanning the gate lines and a non-scanning period during one vertical scanning period. The drive circuit 301 includes netA(n), an output switching element M5 connected to netA(n), and a reset circuit R. The output switching element M5 applies a selection voltage to the gate line GLn. The potential of netA(n) changes between a first potential that is equal to or higher than a threshold voltage of the output switching element M5, and a second potential that is lower than the first potential. In the drive circuit 301 wherein a period while netA(n) thereof has the second potential overlaps with the non-scanning period, the reset circuit R resets the potential of netA(n) to the second potential, before the resumption of the scanning period after the non-scanning period.