Display Panel Driving Circuit Offline Quality Test Method

Resolve Bottlenecks,
Find Innovative Solutions
Generate Solutions

Solution Overview

Problem

Current display panel life time testing methods, such as accelerated aging tests, are time-consuming and complex, affecting production efficiency and capacity, as they require in-line testing and additional procedures after bonding.

Innovation Solution

A driving circuit for display panels with a control circuit and gate driving circuit that allows switching between normal display and test modes by altering input signals, enabling off-line quality testing after assembly, thereby simplifying the testing process and improving efficiency.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Loss of time

If in-line accelerated aging test method is used, then test time is reduced, but production efficiency is seriously affected due to occupying production line machine for dozens of hours

Engineering Contradiction:
Improvetest timeVSAvoidproduction efficiency
Core Design Contradiction:
Loss of timeVSProductivity

Solution Approach 1:

The patent separates the quality test process from the production line by dividing it into independent pre-bonding and post-bonding stages. The gate driving circuit is extracted as a separate testable module that can be tested offline before panel bonding, eliminating the need to occupy production line machines for dozens of hours and thus resolving the contradiction between reduced test time and maintained production efficiency

Inventive Principle:
Principle #1Segmentation

Solution Approach 2:

The patent implements preliminary testing of the gate driving circuit before panel bonding by applying test voltages to switching elements in advance. This preliminary action allows quality assessment to be completed beforehand, eliminating the need for lengthy in-line testing during production and thereby maintaining production efficiency while ensuring quality

Inventive Principle:
Principle #10Preliminary action

2Loss of time

If in-line accelerated aging test method is used, then test time is reduced, but testing process becomes more complicated requiring additional bonding and lighting measurement procedures

Engineering Contradiction:
Improvetest timeVSAvoidtesting process complexity
Core Design Contradiction:
Loss of timeVSDevice complexity

Solution Approach 1:

The patent extracts the gate driving circuit testing function from the complete panel assembly and performs it as a separate, standalone test before bonding. By taking out this specific function and testing it independently with simplified voltage application, the patent eliminates the need for complex post-bonding procedures including additional bonding steps and lighting measurements, thus reducing process complexity while maintaining efficient testing

Inventive Principle:
Principle #2Taking out (Extraction)

3Reliability

If accelerated aging test with hot and humid environment is used, then life time estimation is achieved, but test requires hundreds to thousands of hours to complete

Engineering Contradiction:
Improvelife time estimationVSAvoidtest duration
Core Design Contradiction:
ReliabilityVSLoss of time

Solution Approach 1:

The patent changes the test parameters from conventional hot and humid environmental conditions to electrical stress conditions by applying specific voltages (such as VGH, VGL, or intermediate voltages) to switching elements. This parameter change enables accelerated aging through electrical stress rather than environmental stress, achieving reliable lifetime estimation through electrical characteristics while dramatically reducing test duration from hundreds to thousands of hours to a much shorter period

Inventive Principle:
Principle #35Parameter changes

Data Source

PatentUS10026345B2Driving circuit of display panel and the quality test method thereof
Publication Date: 2018.07.17 TCL CHINA STAR OPTOELECTRONICS TECHNOLOGY CO LTD
  • US10026345B2 patent drawing
  • US10026345B2 patent drawing
  • US10026345B2 patent drawing

AI summary

The present disclosure discloses a driving circuit of display panel and the quality test method thereof. The driving circuit comprises a control circuit and a gate driving circuit. The control circuit comprises a first control output terminal used to output a first control signal and a second control output terminal used to output a second control signal. The gate driving circuit comprises a driving input terminal. In normal display mode, the driving input terminal receives the first control signal from the first control output terminal; in test mode, the driving input terminal receives the second control signal from the second control output terminal.