Display Electrode Measurement Layout for Layer Overlay Accuracy
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Solution Overview
Problem
Current display devices face challenges in accurately measuring the intervals and overlay between conductive layers and insulating layers in pixels, which can lead to defects in light emission and product reliability.
Innovation Solution
The display device incorporates measurement patterns and areas with specific electrode and insulating layer configurations, including measurement holes and electrodes, to indirectly measure the relative positions and overlaps of layers during manufacturing, ensuring precise control and reducing errors.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If measurement patterns are added to measure layer intervals and overlay, then measurement precision is improved, but device complexity increases
Solution Approach 1:
The patent divides the measurement function into separate measurement patterns (first measurement pattern, second measurement pattern, third measurement pattern) that are spatially segmented within the pixel structure. Each measurement pattern targets specific layer interfaces, allowing independent measurement of different parameters without requiring a single complex measurement system.
Solution Approach 2:
The patent introduces measurement patterns as intermediary structures that facilitate indirect measurement of layer positions. These patterns serve as mediators between the manufacturing process and quality control, enabling measurement of intervals and overlay without directly measuring the functional layers themselves.
2Manufacturing precision
If measurement patterns with multiple layers are added, then manufacturing precision control is improved, but ease of manufacture deteriorates
Solution Approach 1:
The patent merges the measurement patterns with the existing pixel structure by integrating them into the same substrate and layer stack. The measurement patterns share common layers (such as the first insulating layer and electrode structures) with the functional pixel elements, allowing simultaneous fabrication through unified manufacturing processes.
Solution Approach 2:
The measurement patterns are designed to serve multiple measurement purposes within a single structure. The same measurement pattern configuration can measure both interval distances and overlay alignment, reducing the need for separate measurement structures for different parameters.
Data Source
AI summary
A display device includes a light emitting area and a sub-area disposed at a side of the light emitting area, a measurement area disposed in the sub-area, measurement patterns and a first electrode extension portion being disposed in the measurement area, a first electrode and a second electrode that are disposed in the light emitting area and spaced apart from each other, and face each other, a first insulating layer disposed on the first electrode and the second electrode, at least a part of the first insulating layer being disposed on the first electrode extension portion, and at least one light emitting element having ends disposed on the first electrode and the second electrode in the light emitting area. The measurement area includes a first measurement area in which a first measurement hole exposing a part of an upper surface of the first electrode extension portion is disposed.