Display Static Electricity Test Wiring for Open-Defect Detection

The patent applies preliminary action by pre-configuring test wires (first test wires and second test wire) that are embedded within the static electricity prevention layer structure before final device assembly. These test wires create predetermined current paths that allow defect detection to be performed early in the manufacturing process, enabling open defects to be identified before the device is completed and shipped.

The patent uses test wires as intermediary elements that facilitate the detection of open defects in the static electricity prevention layer. The first test wires are connected to the static electricity prevention layer, and the second test wire connects to the first test wires, creating a chain of intermediaries that transmit electrical signals through the prevention layer, allowing indirect detection of defects without directly probing the prevention layer itself.

The patent applies segmentation by dividing the test wire structure into multiple functional segments: first test wires that directly contact the static electricity prevention layer, and a second test wire that connects to the first test wires. This segmentation allows each component to have a specific function while collectively providing comprehensive defect detection capability across the display device.

The test wire structure serves multiple functions: it provides electrical connection for static electricity prevention, creates current paths for defect detection, and enables early testing during manufacturing. By designing the test wires to fulfill multiple roles simultaneously, the patent reduces the need for separate dedicated test structures, thereby limiting the increase in device complexity.