Display Manufacturing Facility Abnormality Detection
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Solution Overview
Problem
Existing methods are inadequate for efficiently identifying which manufacturing facilities in a display manufacturing process are abnormal, leading to difficulties in detecting defects in the manufacturing process.
Innovation Solution
A method involving the collection of facility information data, preparation of a display module, obtaining preliminary and real-time inspection data through on-off tests, associating facility information with inspection data, and using a database to determine the facility causing abnormality in the display module.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If multiple manufacturing facilities are used to manufacture display panels, then production capacity and versatility are improved, but it becomes difficult to identify which specific facility is causing defects
Solution Approach 1:
The patent segments the manufacturing process by collecting facility information data that identifies specific facilities used at each manufacturing step. This segmentation allows the system to trace defects back to individual facilities rather than treating the entire manufacturing process as a single unit, thereby resolving the difficulty of identifying defect sources in multi-facility production.
Solution Approach 2:
The patent implements a feedback mechanism where inspection data from display modules is correlated with facility information data stored in a database. When defects are detected, the system queries the database to identify which facilities were involved in manufacturing the defective panels, providing feedback that pinpoints the defect source and enables targeted corrective actions.
2Measurement precision
If comprehensive inspection data is collected from all manufacturing facilities, then defect detection accuracy is improved, but data processing complexity and time consumption increase
Solution Approach 1:
The patent applies preliminary action by collecting and storing facility information data during the manufacturing process itself, before final inspection occurs. This pre-collection and organization of data in a database structure enables rapid querying and analysis during inspection, avoiding the need to gather and process all facility data from scratch when defects are detected.
Solution Approach 2:
The patent creates a digital copy of the manufacturing process by storing facility information data that replicates which facilities were used for each display panel. This digital twin or copy allows the inspection system to analyze defect sources without physically retracing or re-measuring the entire manufacturing process, significantly reducing inspection time while maintaining accuracy.
Data Source
AI summary
A method of determining whether a display manufacturing facility is abnormal includes a first step of obtaining facility information data of facilities used to manufacture a display panel, a second step of preparing a display module by attaching a printed circuit board and a driving chip to the display panel, a third step of obtaining preliminary inspection data through an on-off test on the display module, a fourth step of associating the facility information data with the preliminary inspection data, establishing a database by repeatedly performing the first step to the fourth step, obtaining real-time inspection data through an on-off test on a display module to be inspected, determining whether the display module to be inspected is normal, and determining a facility causing abnormality of the display module, from the real-time inspection data by using the database, in case that the display module to be inspected is abnormal is determined.