Display Device Gate-Line Segmentation for Rapid Defective-Subpixel Detection
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Solution Overview
Problem
Existing display devices face challenges in quickly detecting defective subpixels, as conventional sensing methods take a long time, which is impractical for commercial applications.
Innovation Solution
A display device and driving method that includes a first middle scan signal supply time to detect defective subpixels by supplying turn-on signals to a specific gate line group and turn-off signals to another group, followed by multiple middle detections and a final detection, enabling rapid identification of defective subpixels.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Loss of time
If conventional sensing methods are used to detect defective subpixels, then detection accuracy is maintained, but detection time becomes excessively long
Solution Approach 1:
The patent segments the gate lines into multiple groups (first gate line group and second gate line group) and performs detection by selectively activating these groups in sequence. This segmentation allows the system to divide the detection task into smaller, manageable portions, significantly reducing the total detection time while maintaining accuracy through systematic checking of each segment.
Solution Approach 2:
The patent performs preliminary actions by pre-charging capacitors in the display panel before the detection process begins. This preliminary charging ensures that the detection circuitry is ready and eliminates the need for time-consuming setup procedures during actual detection, thereby reducing overall detection time without compromising reliability.
2Productivity
If sensing methods are performed between image driving times, then defective subpixels can be detected, but the detection process takes a long time
Solution Approach 1:
The patent merges the detection process with the existing image driving cycle by performing defective subpixel detection during the same time frame as normal image display. Specifically, the detection is conducted during the period when gate lines are being scanned for image rendering, effectively combining two functions (image display and defect detection) into a single operational cycle, thereby eliminating additional detection time.
Solution Approach 2:
The patent implements periodic action by repeatedly scanning through different gate line groups in a cyclic manner during the detection process. The system periodically activates different segments of gate lines and measures their responses, allowing efficient use of available time within the image driving cycle to maximize detection speed without extending the overall detection window.
3Loss of time
If all gate lines are activated simultaneously for detection, then detection can be performed, but the complexity and time consumption increase
Solution Approach 1:
The patent divides the complete set of gate lines into multiple discrete groups (first gate line group and second gate line group) and controls them independently. This segmentation simplifies the control logic by allowing the system to activate and measure specific groups sequentially rather than managing all gate lines simultaneously, thereby reducing both time consumption and control complexity.
Solution Approach 2:
The patent applies partial action by activating only the necessary gate line groups for detection at any given time, rather than activating all gate lines simultaneously. The system selectively activates the first gate line group, measures the response, then activates the second gate line group for measurement, using only the minimum required action at each step to achieve complete detection, thus reducing overall complexity and time requirements.
Data Source
AI summary
A display device and a driving method thereof are disclosed. In a defective subpixel detection time for detecting a defective subpixel, a gate driving circuit may supply turn-on signals to a first-first gate line group included in a plurality of gate lines and supply turn-off signals to a first-second gate line group other than the first-first gate line group among the plurality of gate lines, thereby quickly detecting a defective subpixel.