Display Inspection Circuit Using Segmented Transistors
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Solution Overview
Problem
In multimedia devices, the increasing integration of elements in display panels leads to a larger area occupied by signal lines, which reduces the available display area, and existing defect detection methods lack accuracy, affecting manufacturing yield.
Innovation Solution
A display device design with an inspection circuit that includes alternately arranged first and second connection lines, connected to data lines, and transistors controlled by different inspection signals, allowing for improved defect detection accuracy and reduced non-display area by using intermediate connection lines at the display area.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If the degree of integration of elements in the display panel increases and the number of signal lines increases, then the functionality and resolution of the display device are improved, but the area occupied by signal lines increases, reducing the display area
Solution Approach 1:
The patent introduces intermediate connection lines that extend data lines from the display area into the non-display area, effectively utilizing the non-display area for signal routing. This dimensional redistribution allows more signal lines to be accommodated without encroaching on the display area, thus maintaining display area while supporting increased functionality and resolution.
2Productivity
If conventional defect detection methods are used, then the inspection process is simple, but the defect detection accuracy is insufficient, affecting manufacturing yield
Solution Approach 1:
The inspection circuit is segmented into multiple independent transistor groups (first through sixth transistors), each controlling specific data lines through separate inspection signals. This segmentation allows for targeted inspection of different line groups, improving defect detection accuracy by isolating and individually testing each line or line group, thereby enhancing manufacturing yield through more precise defect identification.
Solution Approach 2:
The intermediate connection lines serve as intermediaries between the data lines in the display area and the inspection circuit in the non-display area. These intermediaries enable the inspection circuit to access and test data lines without interfering with normal display operations, allowing for accurate defect detection while maintaining display functionality.
3Device complexity
If signal lines are arranged only within the display area, then the layout is compact, but the non-display area is insufficient for proper signal line routing and inspection circuits
Solution Approach 1:
The patent utilizes the non-display area as an additional dimension for signal line routing by introducing intermediate connection lines that extend data lines into the non-display area. This approach provides sufficient space for signal line routing and inspection circuit placement without compromising display area compactness, as the display area itself remains dedicated to pixel arrays.
Data Source
AI summary
A display device includes: a display panel; and an inspection circuit at a non-display area. The display panel includes: first data lines at a display area; first connection lines at the non-display area; second data lines at the display area; and second connection lines at the non-display area. The inspection circuit includes: first transistors to be controlled by a first inspection signal of a first inspection line; second transistors to be controlled by a second inspection signal of a second inspection line; third transistors to be controlled by a third inspection signal of a third inspection line; fourth transistors to be controlled by a fourth inspection signal of a fourth inspection line; fifth transistors to be controlled by a fifth inspection signal of a fifth inspection line; and sixth transistors to be controlled by a sixth inspection signal of a sixth inspection line.