Display Inspection Circuit Using Digital Logic for Line Defects
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing in-vehicle display devices using thin film transistors face challenges with increased circuit size, manufacturing costs, and complex inspections due to the use of analog circuits for detecting line defects, which are difficult to calibrate when thin film transistor properties vary.
Innovation Solution
A display device with an inspection circuit that supplies alternating voltages in different periods to detect abnormalities using digital logic circuits, eliminating the need for analog comparators and reducing circuit size and inspection costs.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If analog circuits (comparators) are used to detect line defects, then detection functionality is achieved, but circuit size increases and manufacturing cost increases
Solution Approach 1:
The patent replaces analog comparator circuits with digital logic circuits for line defect detection. Specifically, it uses digital AND gates and OR gates to perform the detection function that was previously accomplished by analog voltage comparison. This substitution of digital for analog circuitry reduces the physical circuit size while maintaining the detection capability.
2Reliability
If analog circuits (comparators) are used to detect line defects, then detection functionality is achieved, but manufacturing and inspection cost increases
Solution Approach 1:
The patent replaces expensive analog comparator circuits with simpler, more cost-effective digital logic circuits. The use of standard digital logic gates (AND, OR) simplifies the manufacturing process and reduces inspection complexity compared to calibrating and maintaining analog comparators, thereby lowering overall manufacturing and inspection costs.
3Measurement precision
If analog comparators are used for detection, then voltage level comparison is possible, but calibration becomes difficult when thin film transistor properties vary
Solution Approach 1:
The patent replaces analog voltage comparison with digital logic operations. Instead of using comparators that require calibration to threshold voltages, the invention uses digital AND gates to detect whether voltages exceed reference levels and OR gates to combine detection results. This digital approach eliminates calibration complexity while maintaining measurement precision.
4Productivity
If multiple types of abnormalities are inspected simultaneously, then inspection efficiency improves, but circuit complexity increases
Solution Approach 1:
The patent merges multiple abnormality detection functions into a unified digital logic circuit structure. By using OR gates to combine the outputs of multiple AND gate detectors, the system can simultaneously inspect for different types of abnormalities (such as short circuits and open circuits in different lines) without requiring separate independent circuits for each detection type, thus improving inspection efficiency while controlling circuit complexity.
Data Source
AI summary
In a display device and a method for inspecting the display device, precharge circuits are arranged on both sides of gate lines. Precharge circuits are arranged on both sides of data lines. A common electrode inspection circuit is connected to a common electrode. An inspection data processing circuit is arranged at one end of the gate lines. An inspection data processing circuit is arranged at one end of the data lines. In a first period, a first voltage is supplied to some of the gate lines, the data lines, and the common electrode. In a second period, a second voltage is supplied to some of the gate lines, the data lines, and the common electrode. The inspection data processing circuits acquire the voltage levels of the gate lines and the data lines based on the supply of the second voltage.