Display Surface Inspection Calibration for Perceived Distortion

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Solution Overview

Problem

Existing inspection methods for display devices fail to accurately align surface quality inspection results with user-perceived visual distortions due to differences in layer thickness and number within the device, leading to inaccuracies in quality assessment.

Innovation Solution

An inspection apparatus and method that uses an inclined light-blocking pattern with varying intervals and a measurement system to measure reflected light, combined with a processor for data calibration based on user observation data, to align surface quality inspection with user-perceived distortions.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Measurement precision

If surface quality inspection is performed on the outer surface of the display device, then the inspection can be conducted on the visible surface, but the inspection result differs from the user-perceived distortion due to variations in inner layer structure

Engineering Contradiction:
Improvesurface quality inspection accuracyVSAvoidcorrelation with user-perceived distortion
Core Design Contradiction:
Measurement precisionVSReliability

Solution Approach 1:

The patent replaces conventional optical inspection methods with ultrasonic wave-based measurement. Ultrasonic waves are transmitted through the display device and reflected signals are analyzed to detect inner layer variations. This substitution of measurement physics enables direct detection of structural variations that cause visual distortion, resolving the contradiction between surface inspection accessibility and measurement accuracy correlation with user perception.

Inventive Principle:
Principle #28Mechanics substitution (Replace mechanical system)

2Adaptability or versatility

If multiple layers with different numbers and thicknesses are present inside the display device, then the device functionality is achieved, but the surface quality inspection result becomes inconsistent with user-perceived distortion

Engineering Contradiction:
Improvedevice structure flexibilityVSAvoiddistortion measurement accuracy
Core Design Contradiction:
Adaptability or versatilityVSMeasurement precision

Solution Approach 1:

The patent introduces ultrasonic wave transmission as an intermediary measurement mechanism. Instead of directly measuring surface optical properties that are confounded by varying inner layer structures, ultrasonic waves serve as a mediator that penetrates through all layers and provides direct information about structural variations. This intermediary approach decouples the measurement from the complex optical interactions caused by different layer configurations.

Inventive Principle:
Principle #24Intermediary (Mediator)

Applied Scientific Principles

This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.

Function Achieved in This Case

The solution enhances the accuracy of quality inspection by reducing discrepancies between measured surface quality and user-perceived distortions, improving the reliability of defect detection in display devices.

Implementation Method 1

supplying light to the inspection pattern portion positioned to be inclined with respect to the surface of the target display device to form a first angle, the light having passed through the inspection pattern portion is incident on the surface of the target display device, and measuring reflected light reflected from the surface of the target display device

Methodology Applied
Scientific EffectLight reflection: Reflection

Data Source

PatentEP4166937B1Inspection apparatus and inspection method for display device
Publication Date: 2025.12.03 SAMSUNG DISPLAY CO LTD
  • EP4166937B1 patent drawingFigure 1
  • EP4166937B1 patent drawingFigure 2
  • EP4166937B1 patent drawingFigure 3

AI summary

An inspection apparatus for a display device, including: a light supplier (300) that supplies light to a surface of the display device(100); an inspection pattern (400) portion positioned between the display device and the light supplier; a measurement portion (500) that measures reflected light reflected from the surface of the display device; and a processor (600) that processes data of the reflected light measured by the measurement portion, wherein the processor includes a calibration data portion (600b) including calibration data and a calibrator (600c) calibrating the data using the calibration data of the calibration data portion.