Inspection Unit Design for High-Resolution Display Data Line Defect Detection
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Solution Overview
Problem
Current display device inspection methods are inefficient in detecting defects in high-resolution data lines, leading to potential yield losses due to the inability to accurately differentiate between normal and defective signals in densely packed data line configurations.
Innovation Solution
The implementation of a display device with a unique inspection unit design, where data lines are divided into groups with specifically arranged inspection lines that allow for differential signal scanning and output analysis, enabling the detection of defects through distinct waveform patterns and potential differences, even in closely spaced data lines.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Manufacturing precision
If data lines are densely packed to increase display resolution, then display resolution is improved, but the ability to accurately detect defects in data lines deteriorates
Solution Approach 1:
The data lines are divided into multiple groups, with each group containing multiple data lines. Inspection lines are selectively formed for specific groups (e.g., odd-numbered or even-numbered groups) rather than all data lines. This segmentation allows the inspection system to differentiate between adjacent data lines by applying signals to specific groups and analyzing the resulting waveforms, thereby maintaining defect detection accuracy even when data lines are densely packed.
2Measurement precision
If inspection lines are added to all data lines to improve defect detection, then defect detection capability is improved, but device complexity increases
Solution Approach 1:
Instead of providing inspection lines for all data lines uniformly, the invention applies inspection lines selectively to specific groups of data lines (e.g., alternating odd and even groups). This local differentiation reduces the overall number of inspection lines required while maintaining the ability to detect defects in all data lines through the grouped inspection approach, thereby reducing device complexity.
Solution Approach 2:
The inspection lines serve multiple functions: they can inspect multiple data lines within a group simultaneously, and different groups can be inspected by different inspection lines. This multi-functionality reduces the total number of inspection lines needed compared to a one-to-one inspection line-to-data line configuration.
3Measurement precision
If inspection lines are placed close to data lines to improve inspection accuracy, then measurement precision is improved, but signal differentiation between normal and defective signals deteriorates
Solution Approach 1:
Data lines are segmented into groups, and inspection lines are assigned to specific groups. When an inspection line is activated, it receives signals from multiple data lines within its group. By analyzing the waveform patterns and applying signals to different groups sequentially, the system can differentiate between normal and defective signals even when inspection lines are placed close to data lines, preventing signal information loss.
Data Source
AI summary
A display device and an inspection method of the display device includes: a display area including pixels and data lines; and a non-display area located around the display area and including an inspection unit, in which a first data line includes a first inspection line located in the inspection unit, a second data line adjacent to the first data line includes a second inspection line located in the inspection unit, the first inspection line extends in a second direction different from the first direction, the second inspection line includes a first portion extending in the second direction, a second portion bent toward the first inspection line from the first portion and then extending toward the first inspection line, and a third portion bent from the second portion and extending in parallel with the first inspection line, and end portions of the first and second inspection lines are spaced apart.