Display Device Inspection Wiring for Defect Detection
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Solution Overview
Problem
Existing display devices cannot accurately detect wiring defects in the wiring line groups, leading to undetected defects in the manufacturing process, which results in a decrease in manufacturing yield due to the integration of expensive components like driving IC chips and flexible print circuit boards.
Innovation Solution
A display device layout with separate wiring line groups for odd-numbered and even-numbered scan lines, each with dedicated inspection wiring lines, allows for the input of specific inspection signals to detect defects in both the wiring line groups and scan lines, enabling precise defect detection before subsequent fabrication steps.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a single wiring line group is used to connect scan line driving circuit and scan lines, then the device structure is simpler, but wiring defects cannot be inspected
Solution Approach 1:
The scan lines are divided into odd-numbered scan lines and even-numbered scan lines, with separate wiring line groups (first wiring line group and second wiring line group) connecting to each. This segmentation enables independent inspection of each wiring line group through dedicated inspection wiring lines, resolving the contradiction between reliability and device complexity.
2Productivity
If inspection wiring lines are added to inspect wiring defects, then manufacturing yield increases, but device complexity increases
Solution Approach 1:
Inspection wiring lines are incorporated into the display device structure before the final assembly and manufacturing steps. This preliminary action allows wiring defects to be detected early in the manufacturing process, preventing defective panels from proceeding to subsequent expensive assembly steps involving driving IC chips and FPC, thereby improving manufacturing yield without excessive complexity.
3Measurement precision
If separate wiring line groups are used for odd and even scan lines, then wiring defects in wiring line groups can be inspected, but the layout becomes more complex
Solution Approach 1:
Different regions of the display device are assigned different functions: the first wiring line group with its inspection wiring lines is disposed on one end side of the peripheral part, while the second wiring line group is disposed on the other end side. This local differentiation enables precise defect detection in each wiring line group while organizing the layout systematically to manage complexity.
Data Source
AI summary
A display device includes a first wiring line group of wiring lines connected to odd-number-th scan lines, a second wiring line group of wiring lines connected to even-number-th scan lines, a first inspection wiring line connected to first wiring lines of the first wiring line group, a second inspection wiring line connected to second wiring lines of the first wiring line group, which neighbor the first wiring lines, a third inspection wiring line connected to third wiring lines of the second wiring line group, and a fourth inspection wiring line connected to fourth wiring lines of the second wiring line group, which neighbor the third wiring lines.