Display Light Control Layer Inspection Pattern for Etching Precision

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Solution Overview

Problem

Existing display devices face challenges in controlling the viewing angle of images, particularly in vehicles and other environments where reflections can interfere with drivers, and in protecting privacy by preventing passengers from viewing images displayed in front of drivers.

Innovation Solution

A display device with a light control layer that includes a light transmitting film, a light blocking film, and an inspection pattern. The inspection pattern is integrated into the light control layer to measure the etching amount and shape of the light transmitting layer, enhancing the reliability of the light control layer.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Adaptability or versatility

If a light control layer with light transmitting and light blocking films is used to control viewing angle, then viewing angle control and reflection prevention are improved, but manufacturing precision and reliability of the light control layer deteriorate due to difficulty in inspecting etching quality

Engineering Contradiction:
Improveviewing angle controlVSAvoidetching inspection precision
Core Design Contradiction:
Adaptability or versatilityVSManufacturing precision

Solution Approach 1:

The inspection pattern is formed in advance during the manufacturing process, before final assembly and inspection. This allows etching quality to be measured at an optimal stage when the light control layer is accessible and can be inspected without disassembly, ensuring manufacturing precision is maintained while achieving viewing angle control functionality

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

An inspection pattern consisting of inspection electrodes and inspection lines is introduced as an intermediary element. This pattern serves as a mediator that enables indirect measurement of etching quality through electrical continuity tests, allowing precise inspection of the light control layer without directly observing the etched regions

Inventive Principle:
Principle #24Intermediary (Mediator)

2Measurement precision

If the inspection pattern is formed by etching the light transmitting film to expose the light blocking film, then etching amount and shape can be measured, but the complexity of the manufacturing process increases

Engineering Contradiction:
Improveetching amount measurementVSAvoidmanufacturing process complexity
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The inspection pattern manufacturing is merged with the existing light control layer fabrication process. The inspection electrodes and inspection lines are formed using the same etching steps and material layers as the functional light transmitting and light blocking films, combining inspection functionality with the display structure without adding separate manufacturing steps

Inventive Principle:
Principle #5Merging (Combining)

Solution Approach 2:

The inspection pattern uses the same material layers and etching processes as the functional light control layer components. The inspection electrodes utilize the same conductive materials and the inspection lines use the same insulating or conductive layers as the operational films, allowing universal manufacturing equipment and processes to produce both functional and inspection elements

Inventive Principle:
Principle #6Universality (Multi-functionality)

Data Source

PatentUS20250057025A1Display device and method for inspecting the display device
Publication Date: 2025.02.13 SAMSUNG DISPLAY CO LTD
  • US20250057025A1 patent drawing
  • US20250057025A1 patent drawing
  • US20250057025A1 patent drawing

AI summary

A display device includes, a substrate, a light emitting element layer on the substrate and including a plurality of light emitting elements, and a light control layer on the light emitting element layer and including a light transmitting film and a light blocking film. The light control layer further includes an inspection pattern that overlaps the light blocking film in a first direction, and the inspection pattern extends in the first direction which is the same direction as an extension direction of regions of the light blocking film.