Display Marker Detection Under Low-Exposure Imaging
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Solution Overview
Problem
Conventional monitoring systems struggle to accurately detect non-luminescent markers on display panels of material testing machines due to low camera exposure, which can lead to marker invisibility or interference from disturbance light.
Innovation Solution
A monitoring device and system that includes image processing units to generate grayscale, blurred, and binarized images from camera inputs, enabling detection of markers even at low exposure levels.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If the exposure of the camera is set low, then the marker appears dark in the photographed image, but the marker cannot be detected from the photographed image
Solution Approach 1:
The patent applies preliminary action by performing blur processing on the grayscale image before binarization. This preprocessing step creates a blurred image that is then used to determine the binarization threshold, allowing the marker to be properly highlighted even in low-exposure conditions. The blur processing smooths the image and helps distinguish the marker from background noise before the critical binarization step.
Solution Approach 2:
The patent changes parameters by transforming the image through multiple processing stages: converting to grayscale, applying blur processing with specific filter parameters, and then binarizing based on the blurred image. These parameter changes in the image processing pipeline enable marker detection despite low camera exposure by progressively enhancing the marker's distinguishability.
2Measurement precision
If the exposure of the camera is increased, then the marker becomes visible, but disturbance light influences the photographed image
Solution Approach 1:
The patent extracts the essential marker information from the photographed image through a series of processing steps. By converting to grayscale and applying blur processing, the method extracts the marker's positional and shape information while filtering out disturbance light and other harmful factors. The binarization step then cleanly separates the marker from the background, effectively taking out the useful signal from the noise.
Solution Approach 2:
The patent converts the harmful effect of low exposure (which makes markers invisible) into a benefit by using image processing to enhance contrast. Similarly, it handles disturbance light by using blur processing to average out random noise while preserving the marker's structural information. The processing pipeline transforms these adverse conditions into opportunities for robust marker detection.
3Measurement precision
If blur processing is applied to the photographed image, then the marker can be highlighted, but processing time increases
Solution Approach 1:
The patent applies partial action by performing blur processing selectively and only to the extent necessary for marker detection. The blur processing is applied to the grayscale image, and then the processed image is used specifically for determining the binarization threshold. This partial processing approach achieves marker highlighting without unnecessarily increasing processing time through excessive or redundant operations.
Data Source
AI summary
A monitoring device is a monitoring device of a material testing machine including a display having a marker on a display panel. The monitoring device includes: an acquisition unit that acquires a photographed image of a camera that photographs the display panel; a first generation unit that generates a first processed image obtained by gray-scaling the photographed image; a second generation unit that generates a second processed image obtained by performing blur processing on the first processed image; a third generation unit that generates a third processed image obtained by binarizing the first processed image based on the second processed image; and a first detection unit that detects the marker from the third processed image.