Display Module Substandard State Detection via Peripheral Conductive Lines

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Solution Overview

Problem

Conventional electronic devices face challenges in accurately detecting minor substandard states during manufacturing, which can lead to partial damage or malfunction, affecting product reliability.

Innovation Solution

A display module with a display area, intersecting conductive lines, and substandard state detection lines in the non-display area, where a third conductive line is electrically connected to the circuitry and extends along the periphery, allowing for accurate detection of substandard states by alternately supplying signals and comparing display states.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Volume of moving object

If miniaturization display technique is applied to electronic device, then device size is reduced, but detection of minor substandard states becomes more difficult

Engineering Contradiction:
Improvedevice sizeVSAvoiddetection of minor substandard states
Core Design Contradiction:
Volume of moving objectVSMeasurement precision

Solution Approach 1:

The patent applies preliminary action by extending the third conductive line into the non-display area before potential damage can occur. This allows the detection system to be positioned in advance in the non-display area, enabling early detection of minor substandard states in the display area through the extended conductive line that serves as a detection antenna.

Inventive Principle:
Principle #10Preliminary action

Solution Approach 2:

The patent uses the third conductive line as an intermediary element that extends from the display area into the non-display area. This intermediary structure transfers detection signals from the miniaturized display area to the detection circuitry in the non-display area, enabling precise detection despite the reduced device size.

Inventive Principle:
Principle #24Intermediary (Mediator)

2Ease of manufacture

If conventional detection method is used, then manufacturing process is simple, but minor substandard states are not detected accurately

Engineering Contradiction:
Improvemanufacturing process simplicityVSAvoiddetection accuracy of minor substandard states
Core Design Contradiction:
Ease of manufactureVSMeasurement precision

Solution Approach 1:

The patent merges the detection function with the existing conductive line structure by adding the third conductive line that extends into the non-display area. This integration allows the detection system to utilize the existing display module infrastructure while adding minimal manufacturing complexity, achieving both ease of manufacture and improved detection accuracy.

Inventive Principle:
Principle #5Merging (Combining)

3Measurement precision

If third conductive line extends along periphery in non-display area, then detection accuracy is improved, but device complexity increases

Engineering Contradiction:
Improvedetection accuracyVSAvoidconductive line configuration
Core Design Contradiction:
Measurement precisionVSDevice complexity

Solution Approach 1:

The patent applies local quality by concentrating the detection functionality in the non-display area through the extended third conductive line. Rather than complicating the entire device structure, the solution locally enhances detection capability by extending the conductive line only in the non-display area where it serves as an effective detection antenna without interfering with display functionality.

Inventive Principle:
Principle #3Local quality

Data Source

PatentUS10037726B2Detecting method of substandard state and display module and electronic device operating the same
Publication Date: 2018.07.31 SAMSUNG ELECTRONICS CO LTD
  • US10037726B2 patent drawing
  • US10037726B2 patent drawing
  • US10037726B2 patent drawing

AI summary

A display module is provided. The display module includes a display area which includes a plurality of pixels, a plurality of first conductive lines, and a plurality of second conductive lines intersecting the first conductive lines, a non-display area at least partially surrounding the display area, test circuitry electrically connected with the first conductive lines, and a third conductive line electrically connected between one of the first conductive lines and the test circuitry. The third conductive line may include a portion disposed in the non-display area and extending along a periphery of the display area.