Display Module Testing Guide Part Alignment
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Solution Overview
Problem
Existing display module testing methods face reliability issues due to misalignment and coupling failures when connecting test connectors, leading to potential damage or deformation of connectors during the testing process.
Innovation Solution
A display module testing method involving a first and second circuit connected to a guide part, where the guide part is positioned to prevent overlap with the first circuit, allowing for precise alignment and stable connection of test connectors, and is removable along defined holes to avoid design interference.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Area of stationary object
If the second circuit overlaps the first circuit in plan view to reduce space usage, then the area occupied is reduced, but misalignment and coupling failures occur during connector connection
Solution Approach 1:
The guide part acts as an intermediary component that mediates between the first and second circuits. It provides a physical reference structure that enables precise alignment of connectors during connection, eliminating misalignment issues while allowing the circuits to overlap in plan view. The guide part includes alignment features such as protrusions or grooves that guide connector insertion.
Solution Approach 2:
The guide part is disposed on the second circuit before connector connection occurs. This preliminary positioning establishes the correct spatial relationship and alignment between the first and second circuits, preventing misalignment during the actual connector coupling process. The guide part is removed after testing is complete.
2Manufacturing precision
If the guide part is permanently integrated with the second circuit to maintain alignment, then alignment precision is improved, but the device complexity and manufacturing difficulty increase
Solution Approach 1:
The guide part is designed as a separate, independent component rather than being permanently integrated with the second circuit. This segmentation allows the guide part to be manufactured separately using simpler processes, then temporarily attached during testing, and finally removed. The second circuit can be manufactured without the complexity of incorporating permanent alignment features.
Solution Approach 2:
The guide part transitions from a temporary state (attached during testing) to a removed state (after testing). This dynamic approach allows the system to have high alignment precision during the testing phase while maintaining manufacturing simplicity. The guide part is attached using temporary methods such as adhesive or magnetic forces that allow easy removal.
3Device complexity
If the guide part is removed after testing to avoid design interference, then the final product simplicity is improved, but the removal process may cause damage or deformation
Solution Approach 1:
The guide part is designed with features that prevent damage to connectors during removal. This includes providing sufficient attachment strength during testing to maintain alignment, but designing the attachment method to allow clean removal without leaving residues or causing deformation. The guide part may include protective features that cushion connectors during the removal process.
Solution Approach 2:
The guide part serves as a temporary reference structure that is not permanently retained in the final product. It replicates the necessary alignment function during testing, then is removed to leave a simple final product without permanent alignment features. This copying approach allows the temporary structure to perform its function without becoming part of the final design.
Data Source
AI summary
A method of testing a display module includes preparing a display module, a first circuit connected to the display module, and a second circuit connected to the display module and connected to a guide part, disposing the first circuit on a first mounting part of a stage, disposing the second circuit and the guide part on the first circuit and a second mounting part adjacent to the first mounting part of the stage, testing the display module, and removing the guide part from the second circuit.