Display Sub-Pixel Inspection Using Monte Carlo Element Counting
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Solution Overview
Problem
Current methods for inspecting and fabricating display devices are inefficient, particularly in determining the number of light-emitting elements in sub-pixels, which hinders process tact time and accuracy.
Innovation Solution
A method involving scanning a target substrate with an inspection apparatus to obtain images, dividing regions, generating random numbers using Monte-carlo simulation, calculating representative values, and summing these values to determine the number of light-emitting elements, allowing for real-time inspection and fabrication adjustments.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If traditional inspection methods are used to determine the number of light-emitting elements, then measurement accuracy is maintained, but process tact time increases
Solution Approach 1:
The sub-pixel region is divided into multiple first regions, and each first region is further divided into multiple second regions. This segmentation allows parallel processing of multiple regions simultaneously, reducing the overall inspection time while maintaining measurement accuracy through systematic coverage of all areas.
Solution Approach 2:
Gray values are obtained for all second regions before the actual counting calculation is performed. This preliminary data collection enables subsequent random number generation and representative value calculation to proceed rapidly without delays during the final counting phase, thus reducing process tact time.
2Measurement precision
If detailed region division and random number generation are performed, then the number of light-emitting elements is accurately determined, but device complexity increases
Solution Approach 1:
Random numbers are generated as an intermediary between the gray value data and the final light-emitting element count. This intermediary step allows the system to handle measurement uncertainty and variations in gray values through statistical sampling, achieving accurate counts without requiring overly complex direct measurement methods.
Solution Approach 2:
The inspection method transforms physical gray value measurements into statistical parameters (random numbers and representative values) through mathematical transformations. This parameter change approach simplifies the final counting operation while maintaining accuracy, as the complex physical variations are converted into manageable statistical data.
3Manufacturing precision
If representative values are calculated by reflecting multiple variables, then manufacturing precision is improved, but calculation time increases
Solution Approach 1:
Instead of using all possible variables equally, the method selectively incorporates relevant variables (gray value, micro coordinates, global coordinates) into the representative value calculation. This partial action approach maintains manufacturing precision by focusing on the most significant factors while avoiding unnecessary calculations that would increase processing time.
Data Source
AI summary
A method for inspecting a display device includes preparing a target substrate comprising sub-pixels in which light-emitting elements are disposed, dividing each of first regions of the sub-pixels into second regions, obtaining a gray value of each of the second regions, generating a random number using the gray value, calculating a representative value of each of the first regions by reflecting variables in the random number, and summing the representative values of the first regions to calculate a number of light-emitting elements of the sub-pixels.