Display Motherboard Layout for Parallel Substrate Light-On Testing
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Solution Overview
Problem
Existing display technologies face challenges in efficiently testing and aging OLED and QLED display substrates, particularly in ensuring uniform power supply and signal connectivity across multiple substrates during manufacturing processes.
Innovation Solution
A display motherboard design with specific pad and wire configurations, including test pad regions and test wire regions, allows for external devices to provide power and signal connections to multiple display substrates, enabling simultaneous light-on testing and aging procedures.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If multiple display substrates are tested individually, then testing accuracy is maintained, but testing time and manufacturing efficiency deteriorate
Solution Approach 1:
The patent merges multiple display substrates onto a single motherboard for simultaneous testing. The motherboard includes multiple substrate areas, each accommodating a display substrate with its test pads and signal wires connected to a cell test circuit. This allows multiple substrates to be tested together using shared power supply and signal routing, maintaining individual testing accuracy while significantly improving manufacturing efficiency through parallel processing.
Solution Approach 2:
The motherboard design implements universal power supply and signal routing that can serve multiple display substrates simultaneously. The cell test circuit provides common control and testing functions to all substrates on the motherboard, while each substrate maintains its independent test pads and signal connections. This multi-functional approach enables efficient batch testing without compromising individual substrate testing requirements.
2Productivity
If power supply is provided to multiple display substrates simultaneously, then manufacturing efficiency is improved, but power supply uniformity deteriorates
Solution Approach 1:
The power supply system is segmented into multiple independent power supply lines, each dedicated to specific display substrates or substrate areas on the motherboard. This segmentation allows for independent power supply control and optimization for each substrate, ensuring uniform power delivery even when multiple substrates are tested simultaneously, thereby maintaining manufacturing precision while improving overall productivity.
3Reliability
If test wire length is reduced, then signal transmission quality is improved, but device complexity increases
Solution Approach 1:
The motherboard acts as an intermediary structure that provides optimized signal routing between test pads and display substrates. The cell test circuit on the motherboard serves as a mediator that manages signal distribution to multiple substrates, enabling short test wire connections on each substrate while the motherboard handles the complex routing and signal management, thus maintaining signal transmission quality without excessive device complexity at the substrate level.
Data Source
AI summary
A display motherboard comprises at least one substrate region; the substrate region comprises at least one test pad region, at least one test wire region and at least two display substrates; the test pad region comprises a plurality of pads; the test wire region comprises a plurality of signal wires, first ends of the plurality of signal wires being correspondingly connected to the plurality of pads, and second ends of the plurality of signal wires extending to the display substrates in the substrate region, so as to be connected to test circuits of the display substrates; the plurality of pads are configured to allow an external test device to provide, by means of the plurality of pads, test signals to the test circuits of the display substrates in the substrate region, so as to simultaneously perform light-on tests or aging procedures on the display substrates in the substrate region.