Display Panel MUX Circuit Reuse for Narrow-Bezel Touch Sensing
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Solution Overview
Problem
The advancement of narrow bezel display panels is hindered by the fanout area, which occupies significant space and restricts further reduction in bezel width, particularly in large-size display panels with self-capacitive touch functions.
Innovation Solution
The implementation of an array MUX test circuit with series-connected second switches in connection paths between first solder pads and switches, allowing the driver chip to send touch signals while keeping second switches in an off state, thereby reusing conventional array MUX test circuits and avoiding the need for additional MUX circuits.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Adaptability or versatility
If additional MUX circuits are added to support touch signal lines, then touch functionality is improved, but device complexity and bezel area increase
Solution Approach 1:
The array MUX test circuit is designed to serve dual purposes: traditional array testing and touch signal line multiplexing. By configuring switches to connect touch signal lines to the MUX test circuit during touch operation, the same circuit infrastructure handles both array diagnostics and touch control signals, eliminating the need for separate dedicated MUX circuits and reducing overall device complexity while maintaining full touch functionality
Solution Approach 2:
The patent merges the touch signal line routing with the existing array MUX test circuit path. Touch signal lines are physically routed to share connection points and switches with the array test circuit, allowing both signal types to traverse common conductors and switching elements. This consolidation reduces the total number of separate circuit paths and components needed, directly addressing the contradiction between versatility and complexity
2Adaptability or versatility
If additional MUX circuits are added to support touch signal lines, then touch functionality is improved, but bezel area increases
Solution Approach 1:
The array MUX test circuit is designed to serve dual purposes: traditional array testing and touch signal line multiplexing. By configuring switches to connect touch signal lines to the MUX test circuit during touch operation, the same circuit infrastructure handles both array diagnostics and touch control signals, eliminating the need for separate dedicated MUX circuits and reducing overall device complexity while maintaining full touch functionality
Solution Approach 2:
The touch signal line routing is nested within the existing array circuit infrastructure. Touch signal lines are routed to share connection points, switches, and conductors with the array test circuit, effectively embedding the touch control pathway within the already-present circuit architecture. This nesting approach allows touch functionality to be added without requiring proportional increases in bezel area, as the touch signals utilize the spatial and structural resources already allocated for array testing
3Speed
If second switches are kept in on state, then data signal transmission is improved, but touch signal quality deteriorates due to interference
Solution Approach 1:
The switches in the MUX test circuit are configured to dynamically change their state based on the operational mode of the display device. During normal display operation, switches remain in the on state to maintain data signal transmission paths. When touch operation is detected or initiated, the switches transition to an off state to isolate the touch signal lines from potential interference sources. This dynamic switching capability allows the system to optimize for either data transmission or touch signal integrity depending on current operational requirements, resolving the contradiction between the two performance aspects
Data Source
AI summary
A display panel, its control methods, and a display device are provided. Conventional array MUX test circuits of display panel are reused and improved. In a target unit, there is at least one connection path between a first solder pad and a first switch that contains a second switch connected in series. An end of a touch signal line is electrically connected with a first terminal of the first switch in the connection path where the second switch is connected in series. When the display panel performs touch functions, the second switches are controlled in an off state and the data signal lines are short-circuited. Further, based on the array MUX test circuit, a driver chip sends touch signals to touch signal lines to implement touch functions. Narrow bezel designs of display panels are achieved without adding new MUX circuits.