Display Device Pad Segmentation for Probing Deformation Control

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Solution Overview

Problem

Conventional display device manufacturing processes face challenges in reducing pad sizes and maintaining precise alignment, leading to decreased productivity due to deformation issues during testing and modularization, especially with flexible circuit boards.

Innovation Solution

The method involves forming a first pad and a second pad in the peripheral area of a display device panel, with the second pad being electrically connected to the transistor circuit and covered by a sealing member, allowing for separate inspection and modularization without adjacent deformation, thus reducing the need for precise alignment and increasing layout flexibility.

Engineering Contradictions & Design Principles

VSEngineering Contradiction Analysis

1Area of stationary object

If the testing pad and external terminal pad are located adjacent to each other to reduce device size, then the area occupied by pads is reduced, but the external terminal pad is deformed by probing during testing which adversely influences mounting of external elements

Engineering Contradiction:
Improvepad areaVSAvoidmounting reliability
Core Design Contradiction:
Area of stationary objectVSReliability

Solution Approach 1:

The pad structure is segmented into two separate locations: the testing pad is placed in the peripheral area of the panel, while the external terminal pad is located in the terminal area separated from the display area by a predetermined distance. This spatial segmentation prevents deformation of the external terminal pad during probing operations on the testing pad, while still achieving compact device dimensions.

Inventive Principle:
Principle #1Segmentation

2Area of stationary object

If the distance between pads is shortened to reduce device size, then area is reduced, but highly precise positional alignment mechanism is required which increases alignment time and decreases productivity

Engineering Contradiction:
Improvedevice areaVSAvoidalignment speed
Core Design Contradiction:
Area of stationary objectVSProductivity

Solution Approach 1:

The functional areas are segmented into distinct zones: the terminal area for external terminal pads is separated from the display area by a predetermined distance, while the peripheral area contains testing pads. This segmentation allows for relaxed alignment requirements during probing operations, enabling faster alignment processes and higher productivity without compromising device compactness.

Inventive Principle:
Principle #1Segmentation

3Adaptability or versatility

If a member easily deformable by external pressure is located below the testing pad, then flexibility is improved, but the pad and surrounding area are deformed by probing which affects adjacent external terminal pad

Engineering Contradiction:
ImproveflexibilityVSAvoidpad position precision
Core Design Contradiction:
Adaptability or versatilityVSManufacturing precision

Solution Approach 1:

The device structure is segmented into functional zones where the terminal area containing external terminal pads is spatially separated from the peripheral area containing testing pads by a predetermined distance. This segmentation allows flexible members to be positioned below testing pads without causing deformation to adjacent external terminal pads, maintaining both flexibility and manufacturing precision simultaneously.

Inventive Principle:
Principle #1Segmentation

Data Source

PatentUS9640600B2Manufacturing method of display device, display device, and display device formation substrate
Publication Date: 2017.05.02 MAGNOLIA WHITE CORP
  • US9640600B2 patent drawing
  • US9640600B2 patent drawing
  • US9640600B2 patent drawing

AI summary

A manufacturing method of a display device includes forming a pixel in a display area of a panel, forming a transistor circuit in a peripheral area of the panel, the peripheral area being located in the vicinity of the display area, forming a first pad in a part of the peripheral area, forming a second pad in a peripheral area of another panel adjacent to the part of the panel, the second pad being electrically connected to the transistor circuit, performing a driving inspection on the transistor circuit by use of the second pad, and separating the first pad and the second pad from each other after the driving inspection.