Display Device Pad Segmentation for Reliable Test Pin Contact
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Solution Overview
Problem
In display devices, insufficient electrical contact between components can lead to defects in the displayed image, reducing the reliability of both the display device and the test reliability when using test pins.
Innovation Solution
The display device incorporates a driver integrated circuit with pads divided into separate first and second areas, where the second area is partitioned and non-overlapping with contact pins, allowing for improved contact with test pins, and includes a dam structure to define these areas and a solder member for bonding.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If the pad area is made larger to improve contact reliability with test pins, then the contact area increases, but the overall device area increases
Solution Approach 1:
The pad is divided into two distinct areas: a first pad area for contact with the contact pin and a second pad area for contact with the test pin. This segmentation allows each area to be optimized for its specific function without increasing the overall pad footprint, thereby improving contact reliability while maintaining compact device area.
Solution Approach 2:
Different areas of the pad are assigned different functions with different contact requirements. The first pad area is designed for bonding with the contact pin, while the second pad area is designed for testing with test pins. This local differentiation of function allows each region to have appropriate contact characteristics without compromising the other.
2Reliability
If the contact pin width is increased to improve contact reliability, then the contact area with the pad increases, but the alignment precision requirement increases
Solution Approach 1:
By separating the contact pin contact area (first pad area) from the test pin contact area (second pad area), the patent allows the contact pin to have a smaller width that is easier to align with, while still providing sufficient contact area for reliable electrical connection. The test pin can then contact the second pad area independently.
Solution Approach 2:
The dam structure acts as an intermediary element that defines the boundaries between the first and second pad areas. This intermediary structure provides clear alignment references for both the contact pin and test pin, reducing alignment precision requirements by providing physical guides for proper positioning.
3Reliability
If the second pad area is made larger to improve test pin contact reliability, then the contact area for testing increases, but the space for other components decreases
Solution Approach 1:
The pad is segmented into functional zones where the second pad area is specifically allocated for test pin contact. This segmentation allows the test area to be optimized for reliability while the first pad area maintains its bonding function, achieving efficient space utilization without compromising test reliability.
Solution Approach 2:
The pad structure serves multiple functions simultaneously: the first pad area provides electrical bonding for the contact pin, while the second pad area provides testing functionality for test pins. This multi-functionality within a single integrated structure improves space efficiency by eliminating the need for separate test structures.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This design enhances the test reliability of the display device by ensuring effective contact between test pins and pads, reducing alignment issues and maintaining space efficiency.
Implementation Method 1
a solder member disposed in the first pad area of each of the plurality of pads, where each of the plurality of pads is bonded to the corresponding contact pin by the solder member
Data Source
AI summary
A display device includes a display panel including a plurality of pixels disposed in a display area, and a driver integrated circuit electrically connected to the plurality of pixels, where the driver integrated circuit includes a plurality of pads spaced apart from each other, and a driving chip including a plurality of contact pins electrically contacting the plurality of pads, respectively. Each of the plurality of pads includes a first pad area electrically contacting a corresponding contact pin among the plurality of contact pins, and a second pad area partitioned from the first pad area and not overlapping the corresponding contact pin in a plan view.