Printed Display Panel Pixel Testing Using AC Electric Fields
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Solution Overview
Problem
Current probe testing methods for QLED/OLED pixels in display devices cause electrode damage and are inefficient for mass detection, especially as chip sizes shrink and pixel counts increase, leading to increased time and cost due to post-detection laser ablation of defective pixels.
Innovation Solution
A high-speed electrical testing system using a conductive layer, detection probe array, high-frequency AC power supply, and optical/electrical signal measurement modules to create an alternating electric field for contactless detection of QLED/OLED pixels, collecting electrical and optical signals to determine pixel quality without depositing metal electrodes.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If probe testing is used for QLED/OLED pixel detection, then detection can be performed, but electrode damage occurs and detection efficiency is low
Solution Approach 1:
The patent replaces the mechanical contact-based probe testing system with a non-contact electrical testing system. The detection probe array generates an alternating electric field that penetrates the display panel to detect pixel defects without physical contact, thereby eliminating electrode damage while maintaining detection accuracy.
Solution Approach 2:
The patent introduces an alternating electric field as an intermediary between the detection probe array and the QLED/OLED pixels. This electric field serves as a mediator to transmit detection signals through the display panel without requiring direct contact with the electrodes, thus avoiding damage while enabling detection.
2Reliability
If probe testing is used for mass QLED/OLED pixel detection, then detection can be performed, but detection efficiency cannot meet mass production demands
Solution Approach 1:
The patent divides the detection system into multiple detection probes arranged in arrays, with each probe corresponding to specific pixel regions. This segmentation enables parallel detection of multiple pixels simultaneously, significantly improving detection efficiency for mass production while maintaining reliable detection capability.
Solution Approach 2:
By replacing the slow mechanical probe contact method with a non-contact electrical field-based detection system, the patent achieves much faster detection speeds that can meet mass production requirements, while the segmented probe array structure enables parallel processing of multiple pixels.
3Reliability
If defective pixels are detected after panel manufacturing, then detection can be performed, but laser ablation repair is required increasing time and cost
Solution Approach 1:
The patent performs detection at an intermediate stage during the manufacturing process, before the completion of all fabrication steps. This preliminary detection allows defective pixels to be identified early, enabling timely repair or removal without requiring post-manufacturing laser ablation, thus reducing repair time and costs.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The system avoids damage to display panels while significantly improving detection efficiency and accuracy by guiding carrier transport within pixels, allowing timely fault detection before metal electrode deposition, reducing resource waste and process steps.
Implementation Method 1
a high-frequency AC power supply module configured to supply power to form a first alternating electric field between the detection probe array and the conductive layer
Implementation Method 2
the first alternating electric field causing the printed display panel to exhibit electroluminescence when a first direction from the anode terminal to the cathode terminal of a light-emitting pixel coincides with an electric field direction of the first alternating electric field
Implementation Method 3
an optical signal measurement module disposed on one side of the first substrate and configured to collect corresponding light emission information of the printed display panel
Implementation Method 4
an electrical signal measurement module disposed adjacent to the conductive layer and configured to collect corresponding electrical signal information of the printed display panel
Data Source
AI summary
The present invention discloses high-speed electrical testing system applied to printed display panel The system includes: a first substrate containing a conductive layer, and a detection probe array disposed opposite to the conductive layer. The printed display panel has a sandwich-layered structure comprising an anode terminal, a light-emitting layer, and a cathode terminal for its light-emitting pixels. The detection probe array and the conductive layer are electrically connected to a high-frequency AC power supply module, which supplies power to form a first alternating electric field between the detection probe array and the conductive layer. This first alternating electric field causes the printed display panel to exhibit electroluminescence. An electrical signal measurement module is disposed adjacent to the conductive layer, and an optical signal measurement module is disposed on one side of the first substrate. The present invention improves detection efficiency while avoiding damage to the printed display panel during detection.