Display Panel Dummy Region Layout for In-Process Defect Inspection

The patent applies preliminary action by incorporating a testing element group (TEG) structure during the manufacturing process that enables inspection at multiple stages before final product completion. The TEG structure includes dummy light-emitting elements and electrodes that allow real-time monitoring of manufacturing quality, enabling defect identification early in the production process rather than only at the finished product stage.

The patent applies copying by creating a testing element group that replicates the functional characteristics of the actual light-emitting elements in a simplified form. The TEG structure includes dummy light-emitting elements and electrode configurations that mirror the electrical and optical properties of production elements, allowing inspection without requiring complex measurement equipment. This copying approach enables real-time inspection while keeping the additional structure relatively simple and manageable.

The patent applies continuity of useful action by designing the TEG structure to enable continuous or near-continuous inspection during the manufacturing process. The testing elements are integrated into the production line flow, allowing quality monitoring to occur simultaneously with manufacturing operations rather than requiring separate inspection stages. This integration maintains high manufacturing precision while minimizing interruptions and time losses.