Display Panel Electrical Defect Screening Before Emitter Installation
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Solution Overview
Problem
Existing methods for characterizing and defect screening in electronic displays, such as optical testing, require specialized equipment and controlled environments, and cannot begin until light-emitting components are installed, limiting their effectiveness and efficiency.
Innovation Solution
The implementation of electrical testing using internal circuitry, including analog front-end (AFE) and analog-to-digital converter (ADC) circuitry, which allows for characterization and defect screening before self-emissive elements are installed, and employs partial passive mode electrical characterization, crosstalk measurement, and defect detection methods to identify issues before they become apparent.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If optical testing is used to characterize display components and identify defects, then measurement precision is improved, but device complexity increases and testing can only begin after light-emitting components are installed
Solution Approach 1:
The patent replaces optical testing systems with electrical testing systems. Instead of using cameras and optical equipment to detect display defects, the invention uses electrical measurements through AFE and ADC circuitry to characterize display components and identify defects electrically, thereby eliminating the need for complex optical testing equipment
Solution Approach 2:
The patent enables testing to be performed before light-emitting components (such as OLEDs or micro-LEDs) are installed on the display. By conducting electrical characterization and defect screening at an earlier stage in the manufacturing process, the system allows for preliminary detection of issues without requiring the presence of self-emissive elements
2Measurement precision
If optical testing is used for defect screening, then measurement precision is improved, but loss of time increases due to inability to test before component installation
Solution Approach 1:
The patent enables testing to be performed before light-emitting components (such as OLEDs or micro-LEDs) are installed on the display. By conducting electrical characterization and defect screening at an earlier stage in the manufacturing process, the system allows for preliminary detection of issues without requiring the presence of self-emissive elements
Solution Approach 2:
The patent replaces optical testing systems with electrical testing systems. Instead of using cameras and optical equipment to detect display defects, the invention uses electrical measurements through AFE and ADC circuitry to characterize display components and identify defects electrically, thereby eliminating the need for complex optical testing equipment
Data Source
AI summary
Systems and methods are provided for electrical testing to supplement or replace optical testing of an electronic display. Internal testing circuitry that includes analog front end (AFE) and analog-to-digital converter (ADC) circuitry may be included in the electronic display and may be used either alone or in combination with other testing devices to perform electrical characterization and defect screening. The electrical characterization and defect screening may be performed before or after self-emissive elements such as light-emitting diodes are installed, further improving yield. Types of electrical characterization and defect screening may include a partial passive mode electrical characterization of OLEDs, vertical or horizontal crosstalk measurement, scan line integrity testing, pixel bright dot testing, display pixel defect detection, and delayed defect detection for defects that may occur after some extended period of time (e.g., after several minutes, after several hours).