Display Panel Lighting Test Circuit Voltage Isolation
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Solution Overview
Problem
In display devices, the lighting test voltage applied to pixels during the manufacturing process can inadvertently be applied during the image display period, potentially affecting the image quality.
Innovation Solution
A display panel with a lighting test circuit that includes a first test transistor and a second test transistor connected in series, where the gate electrodes of these transistors receive alternating low and high voltage test control signals during the image display period, preventing the lighting test voltage from being applied.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of manufacture
If the lighting test circuit is connected to the pixel through the data line, then the lighting test voltage can be applied to test pixel lighting states during manufacturing, but the lighting test voltage may be inadvertently applied to the pixel during the image display period, affecting image quality
Solution Approach 1:
The patent applies preliminary action by configuring the lighting test circuit with transistors that are pre-arranged to be turned off during the image display period. The test control signal is prepared in advance to ensure the lighting test voltage pathway is blocked before image display begins, preventing any potential harmful voltage application while maintaining the test capability structure.
Solution Approach 2:
The patent uses transistors as intermediary components between the lighting test circuit and the pixel. These transistors act as controllable switches that mediate the voltage transmission, allowing the lighting test voltage to reach the pixel only when needed during manufacturing tests, while blocking it during normal image display operations.
2Reliability
If the lighting test voltage is applied to the pixel during the image display period, then the pixel lighting state can be tested, but it may cause potential damage to the display panel and affect image quality
Solution Approach 1:
The lighting test circuit is pre-configured with control logic that activates before the image display period begins. The test control signal ensures that the switching transistors are in the appropriate state to either allow testing or block voltage, preventing harmful applications before they can occur.
Solution Approach 2:
Transistors serve as intermediary protective elements that control the flow of lighting test voltage. These intermediaries can be dynamically controlled to permit voltage passage during authorized testing intervals while blocking it during image display periods, thereby protecting the display panel from damage while maintaining testing capability.
3Object-affected harmful factors
If the test control signal is continuously switched during the image display period, then the lighting test voltage can be prevented from being applied to the pixel, but it increases the complexity of the control circuit
Solution Approach 1:
The patent employs periodic action by applying the test control signal in a periodic manner that synchronizes with the display operation cycles. The control signal alternates between states to block the lighting test voltage during image display periods while allowing it during designated testing periods, creating a rhythmic control pattern that manages voltage application systematically.
Solution Approach 2:
The patent utilizes parameter changes by varying the voltage level or state of the test control signal to control the switching transistors. By changing the electrical parameters of the control signal over time, the system dynamically adjusts the conductivity state of the transistors to either permit or block the lighting test voltage pathway.
Data Source
AI summary
A display panel includes a pixel connected to a scan line and a data line, and a lighting test circuit which provides a lighting test voltage to the pixel through the data line. The lighting test circuit includes a first test transistor including a first electrode which receives the lighting test voltage, a second electrode and a gate electrode which receives a first test control signal, and a second test transistor including a first electrode connected to the second electrode of the first test transistor, a second electrode connected to the data line and a gate electrode which receives a second test control signal.