Display Panel Line Inversion Test Method
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Solution Overview
Problem
The existing methods for testing display panels using frame inversion methods often result in flicker due to low-frequency test signals, leading to incomplete charging of sub-pixels and incorrect quality classification, even for high-quality pixels.
Innovation Solution
A method employing a line inversion test method where alternating polarities of test signals are applied to specific data lines, allowing for extended charging time and preventing flicker, by using a first test part to supply a test signal to (2K−1)th data lines and a second test part to supply a signal with opposite polarity to 2Kth data lines, ensuring accurate quality assessment.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Object-affected harmful factors
If the frequency is increased for the test signal, then the flicker problem is overcome, but the charging time for sub-pixels becomes short, resulting in incomplete charging and lower lighting level
Solution Approach 1:
The patent divides the data lines into multiple groups (first group, second group, third group, fourth group) and applies test signals to each group sequentially rather than simultaneously. This segmentation allows the test signal frequency to be effectively reduced for each group while still completing the full test within the overall frame period, thus providing sufficient charging time for sub-pixels without causing flicker.
Solution Approach 2:
The patent employs periodic action by sequentially applying test signals to different groups of data lines in a repeating cycle. Each group receives the test signal for a sufficient duration to complete charging, and this periodic sequential application ensures that all sub-pixels are tested while maintaining adequate charging time for each group.
2Ease of operation
If the frame inversion method is used for lighting test, then all sub-pixels can be driven, but flicker occurs due to low frequency test signal
Solution Approach 1:
The patent segments the frame inversion process by dividing data lines into multiple groups and applying test signals to each group sequentially. This segmentation transforms the low-frequency full-frame inversion into multiple higher-frequency sequential group inversions, reducing flicker while maintaining comprehensive sub-pixel testing coverage.
Solution Approach 2:
The patent introduces dynamic control by using a signal generation unit that sequentially generates test signals for different data line groups based on a control signal. This dynamic sequential signal generation allows the system to adapt the testing process to avoid flicker while ensuring all sub-pixels are properly tested.
3Productivity
If test signal is supplied to all data lines simultaneously, then the lighting test can be performed, but some sub-pixels are driven in incomplete charging state
Solution Approach 1:
The patent segments the data lines into multiple groups and applies test signals to each group sequentially rather than simultaneously. This segmentation ensures that each group of sub-pixels receives sufficient charging time while maintaining overall testing efficiency through the structured sequential process.
Solution Approach 2:
The patent applies preliminary action by ensuring that each group of data lines receives the complete test signal sequence before moving to the next group. This preliminary completion of charging for each group before transitioning ensures accurate quality assessment while maintaining efficient overall testing through parallel-izable group processing.
Data Source
AI summary
A display panel including a display part including a plurality of sub-pixels configured to display a plurality of colors, and a plurality of data lines connected with the sub-pixels; a first test part configured to supply a test signal to (2K−1)th data lines (‘K’ is an integer above 0) by each color for the sub-pixels among the plurality of data lines; and a second test part configured to supply a test signal to 2Kth data lines by each color for the sub-pixels among the plurality of data lines when the first test part supplies the test signal. Further, a polarity of the test signal supplied by the second test part is opposite to a polarity of the test signal supplied by the first test part.