Display Panel Motherboard Detection Accuracy via Segmented Alignment
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Solution Overview
Problem
Current automatic optical inspection (AOI) technologies for touch screen panels face challenges in achieving high positioning accuracy for defect detection, particularly when alignment marks are located at the four corners of the display panel motherboard, leading to low detection accuracy.
Innovation Solution
The method involves dividing the display panel motherboard into detection regions, using alignment marks in the periphery of each panel to improve positioning accuracy, and comparing detection images of adjacent panels to identify defects through three-point or five-point comparison methods, with coordinate correction and gray scale analysis to enhance detection precision.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of operation
If alignment marks are located at the four corners of the display panel motherboard for positioning, then the positioning process is simplified, but the positioning accuracy and detection accuracy deteriorate
Solution Approach 1:
The display panel motherboard is divided into multiple detection regions, with each region containing multiple alignment marks. This segmentation allows the system to use multiple reference points for positioning calculation, improving accuracy while maintaining operational simplicity through automated processing of multiple marks.
Solution Approach 2:
The patent transitions from using only corner alignment marks (2D positioning) to utilizing multiple alignment marks distributed across the motherboard surface. This dimensional expansion enables more comprehensive positioning calculations and improves accuracy by incorporating multiple spatial references.
2Measurement precision
If multiple alignment marks are added to each detection region to improve positioning accuracy, then detection accuracy improves, but device complexity increases
Solution Approach 1:
The multiple alignment marks serve dual functions: they are used for positioning calculation and also serve as reference points for defect detection comparison. This multi-functionality allows the system to improve detection accuracy without proportionally increasing overall system complexity.
Solution Approach 2:
The alignment marks automatically serve as reference standards for the detection system. The system uses these marks to self-calibrate and perform positioning calculations without requiring external intervention, thereby managing complexity through automated self-referencing.
3Measurement precision
If three-point or five-point comparison method is used for defect detection, then detection precision improves, but processing time and computational complexity increase
Solution Approach 1:
The detection process is segmented into multiple stages: first acquiring images of multiple panels, then performing three-point or five-point comparison methods on specific detection cells, and finally synthesizing results. This segmentation allows the computationally intensive comparison operations to be focused only on relevant regions and cells.
Solution Approach 2:
The system applies the three-point or five-point comparison method selectively to specific detection cells rather than processing every pixel or region uniformly. This partial action approach maintains high detection precision where needed while reducing overall processing time by avoiding unnecessary computations in non-critical areas.
Data Source
AI summary
A detection method for a display panel motherboard and a display panel motherboard. The detection method for the display panel motherboard including a plurality of display panels arranged in a matrix includes: dividing the display panel motherboard into a plurality of detection regions, at least one detection region corresponding to at least a portion of each display panel in a same string of display panels; performing a defect detection on patterns in all the display panels in the at least one detection region.