Display Panel Motherboard Testing Circuit Isolation
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Solution Overview
Problem
Conventional display panel motherboards have a lower testing efficiency due to the interconnected signal lines, which cause an entire column of display panel main bodies to display poorly, making it difficult to determine the specific location of defective products.
Innovation Solution
The display panel motherboard includes a display region with multiple display panel main bodies and a testing region with a testing circuit. The testing circuit features a first signal end, a control circuit, and signal channels that allow the first signal end to control each display panel main body to display after receiving a control signal, and the control circuit can turn on or off the signal channels to isolate defective products.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Productivity
If multiple display panel main bodies are tested simultaneously in a motherboard, then testing throughput is improved, but the ability to identify defective locations deteriorates
Solution Approach 1:
The patent divides the display panel motherboard into multiple independent testable units by introducing control switches. Each display panel main body can be independently controlled through its own signal channel, allowing individual testing while maintaining the motherboard structure. This segmentation enables precise identification of defective locations without sacrificing testing throughput.
2Device complexity
If signal lines of multiple display panel main bodies are connected to one another, then device complexity is reduced, but measurement precision deteriorates
Solution Approach 1:
The patent introduces control switches as intermediary components between the signal lines and display panel main bodies. These switches act as mediators that can be selectively activated to connect signal lines to specific display panel main bodies for testing. This intermediary mechanism maintains the simplicity of the overall connection structure while enabling precise defective detection by isolating individual units during testing.
Data Source
AI summary
A display panel motherboard, a method for testing the display panel motherboard, and a display panel are provided. The display panel motherboard includes a display region and a testing region. The display region includes a plurality of display panel main bodies, and a signal input end arranged on the plurality of display panel main bodies. The testing region includes a first signal end and a control circuit, and the control circuit controls a signal channel between the first signal end and the signal input end to be on or off. The present application can narrow down a scope of defective products and enhance a testing efficiency.