Display Panel Pattern Testing for Cell-State Image Sticking Detection
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Solution Overview
Problem
Existing display panel manufacturing processes struggle to detect image sticking defects effectively in a cell state due to the need for a pattern test that requires a connected data driver, limiting the ability to identify defects before the module state.
Innovation Solution
Incorporating a lighting test circuit to provide emission data voltage and a pattern test circuit to apply non-emission data voltage to specific pixels, allowing pattern testing in a cell state by alternating voltage application within horizontal times to display pattern images.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If a pattern test is performed using a connected data driver in module state, then image sticking defects can be detected, but the testing process cannot be completed in cell state before data driver connection
Solution Approach 1:
The patent introduces a test controller as an intermediary device that temporarily replaces the data driver function during testing. The test controller connects to the data lines and provides test data signals directly to the pixels, enabling pattern tests to be performed in cell state without requiring the actual data driver. This mediator approach resolves the contradiction by providing the necessary testing capability before the data driver is connected.
Solution Approach 2:
The patent performs pattern tests in cell state as a preliminary action before the data driver is connected and before module assembly. By conducting the pattern test early in the manufacturing process using the test controller, defects can be detected and addressed before final assembly, improving overall manufacturing efficiency and reducing rework costs.
2Measurement precision
If pattern testing is delayed until module state with data driver connection, then complete pattern testing can be performed, but defect identification efficiency is reduced and subsequent module-level testing is required
Solution Approach 1:
The patent performs pattern tests in cell state as a preliminary action before the data driver is connected and before module assembly. By conducting the pattern test early in the manufacturing process using the test controller, defects can be detected and addressed before final assembly, improving overall manufacturing efficiency and reducing rework costs.
Solution Approach 2:
The patent segments the testing process into two stages: cell-level pattern testing performed early in manufacturing using the test controller, and module-level testing performed after assembly. This segmentation allows defect detection to occur at the most efficient point in the manufacturing process, improving productivity while maintaining detection accuracy through the use of specialized test equipment at each stage.
Data Source
AI summary
A display panel includes a plurality of data lines, a plurality of pixels connected to the plurality of data lines, a lighting test circuit that provides an emission data voltage to the plurality of pixels through the plurality of data lines, and a pattern test circuit that provides a non-emission data voltage to a portion of the plurality of pixels through the plurality of data lines after the emission data voltage is provided to the plurality of pixels such that the plurality of pixels display a pattern image.