Display Panel Test Modules for Reduced Probe Alignment
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Existing inspection methods for large size active-matrix organic light-emitting diode (AMOLED) display panels face high alignment precision requirements, high probe contact risks, and increased demand for probes due to complex probe designs, leading to lower inspection accuracy.
Innovation Solution
A display panel design that includes first and second signal lines connected to color pixels, with a first test module that connects to both lines, reducing the need for individual tests and probe alignment, and a control module to control signal line switching, enabling efficient array and electroluminescence inspections.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a probe contact method of full contact is used for inspection, then inspection accuracy is improved, but the requirement for alignment precision and mechanism design of the inspection apparatus probe becomes very high and the risk of missing probe contact increases
Solution Approach 1:
The invention divides the signal lines into two groups: first signal lines connected to first color pixels and second signal lines connected to second color pixels. Correspondingly, the test module is segmented into a first test module for testing first signal lines and a second test module for testing second signal lines. This segmentation allows each test module to focus on specific signal lines, reducing the overall alignment precision requirements while maintaining inspection accuracy for each group.
Solution Approach 2:
The invention introduces a shorting bar as an intermediary component that connects multiple signal lines (both first and second signal lines) to a common test point. This shorting bar acts as a mediator that allows a single probe to test multiple signal lines simultaneously, thereby reducing the number of probes required and lowering the alignment precision requirements for the inspection apparatus.
2Measurement precision
If a probe contact method of full contact is used for inspection, then inspection accuracy is improved, but the risk of missing probe contact increases
Solution Approach 1:
By segmenting the signal lines into first and second groups and providing corresponding first and second test modules, the invention reduces the number of probe contacts required. Each test module handles specific signal lines, which reduces the overall risk of missing probe contacts while maintaining comprehensive inspection coverage through the shorting bar connections.
3Measurement precision
If three R/G/B probes corresponding to data signal lines are used for inspection, then inspection coverage is improved, but the demand for the amount of aligned probes of inspection apparatus increases
Solution Approach 1:
The invention merges the testing of first signal lines and second signal lines into a unified test system. The shorting bar connects both first and second signal lines to common test points, allowing a single probe to test multiple signal lines that would otherwise require separate probes. This merging reduces the total number of probes required while maintaining comprehensive inspection coverage.
Solution Approach 2:
The test modules are designed with multi-functionality: the first test module can test both first signal lines directly connected to it and second signal lines through the shorting bar connection. Similarly, the second test module can test second signal lines directly and first signal lines through the shorting bar. This universal testing capability reduces the number of specialized probes needed.
Data Source
AI summary
An embodiment of the present application provides a display panel, a display panel test method, and a display device. The display panel includes an underlay, signal lines and a first test module. The signal lines include first signal lines and second signal lines. The first signal lines are connected to first color pixels. The second signal lines are connected to second color pixels. first test module is disposed on underlay and are spaced from the signal lines. The first test module is connected to the first signal lines and the second signal lines.