Display Panel Repair Structure for Defective Subpixels
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Solution Overview
Problem
Defects such as bright spots or dark spots in subpixels of display panels occur due to foreign matter, leading to reduced yield and normal emission failure, which can cause image quality deterioration.
Innovation Solution
A display device and panel with a repair structure that includes overlapping patterns and lower metals connected to source electrodes, allowing for laser welding to repair defective subpixels without reducing the aperture ratio or occupying excessive space.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Ease of repair
If a repair structure is added to repair defective subpixels, then the repair capability is improved, but the device complexity increases
Solution Approach 1:
The repair structure is nested within the existing display panel structure by placing the overlapping pattern and buffer layers within the existing layer stack. The lower metals are positioned beneath the active layers, and the overlapping pattern is integrated into the existing pixel structure, allowing repair functionality to be added without fundamentally redesigning the entire device.
Solution Approach 2:
The repair structure utilizes the vertical dimension by adding layers (overlapping pattern, buffer layers) above and below existing structures. The overlapping pattern is positioned to overlap with lower metals in the vertical direction, creating a three-dimensional repair pathway that does not increase the horizontal footprint of the display panel.
2Use of energy by moving object
If the aperture ratio is maintained, then the light emission efficiency is improved, but the repair structure space is constrained
Solution Approach 1:
The repair structure is implemented in the vertical dimension rather than expanding horizontally. The overlapping pattern and buffer layers are stacked above and below existing structures, utilizing the Z-axis space that does not interfere with the horizontal aperture area. This allows the aperture ratio to be maintained while providing sufficient space for the repair structure.
Solution Approach 2:
The buffer layers are implemented as thin film structures that occupy minimal vertical space while providing the necessary repair functionality. The overlapping pattern is designed as a thin conductive layer that can be integrated into the existing thin-film transistor structure without significantly increasing the overall thickness or compromising the aperture ratio.
3Manufacturing precision
If high-resolution implementation is achieved, then the pixel density is improved, but the repair structure occupies less space
Solution Approach 1:
The repair structure components (lower metals, overlapping pattern, buffer layers) are nested within the existing pixel structure boundaries. The overlapping pattern is positioned to overlap with portions of the lower metals that are already present in high-resolution displays, utilizing existing structural elements rather than adding separate repair components that would consume additional pixel area.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
The repair structure enables successful restoration of defective subpixels, maintaining image quality and optimizing production efficiency by reducing energy consumption.
Implementation Method 1
allowing for laser welding to repair defective subpixels
Data Source
AI summary
A display device according to embodiments of the present disclosure may include a first lower metal directly connected to a first pixel electrode or a first source electrode in a first subpixel and overlapping with a first active layer, a second lower metal directly connected to a second pixel electrode or a second source electrode in a second subpixel and overlapping with a second active layer, and an overlapping pattern in which one side overlaps with at least a portion of the first lower metal and another side overlaps with at least a portion of the second lower metal.