Display Panel Gate-Line Layout for Same-Layer Short Detection
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Solution Overview
Problem
Existing display panel manufacturing processes fail to detect short-circuits between adjacent metal lines in the same layer during cell tests, leading to missed detections.
Innovation Solution
The display panel incorporates first and second line groups in different layers, with each group containing gate lines and connecting lines that exhibit voltage differences between adjacent lines, allowing for the detection of short-circuits through cell tests.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Reliability
If two types of detection signals are employed with metal lines arranged in two separate metal layers, then detection efficiency is improved, but short-circuits between adjacent metal lines in the same layer cannot be detected
Solution Approach 1:
The patent changes the voltage parameter of adjacent gate lines from identical to different voltage levels. By applying different voltages to adjacent gate lines in the same metal layer, short-circuits between them can be detected through voltage difference measurements, resolving the detection blind spot while maintaining the two-layer metal line structure
Solution Approach 2:
The patent applies preliminary voltage differences to adjacent gate lines before the cell test. By pre-configuring different voltage levels on adjacent lines, the detection circuit can immediately identify short-circuits when they occur, enabling proactive detection rather than reactive identification
2Device complexity
If metal lines transmitting detection signals are arranged in the same metal layer, then device complexity is reduced, but short-circuits between adjacent lines cannot be detected
Solution Approach 1:
The patent maintains the simple single-layer arrangement but changes the electrical parameter (voltage) of the metal lines. By applying different voltages to adjacent lines in the same layer, the patent achieves both structural simplicity and defect detection capability, resolving the contradiction between device complexity and reliability
Data Source
AI summary
A display panel and an electronic device are provided. In the display panel, first line groups and second line groups are arranged in different layers. In the first line groups, there is a voltage difference between every adjacent pair of gate lines. In the second line groups, there is also a voltage difference between every adjacent pair of gate lines. When a short circuit occurs between adjacent gate lines in the same layer, there is a noticeable change in the voltage on the gate lines, which can be detected through a cell test, effectively reducing the chances of missed detections.