Display Panel Test Circuit for Post-Mounting Crack Detection
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Solution Overview
Problem
Existing display panel manufacturing processes face challenges in detecting internal cracks and defects, particularly after the driving integrated circuit is mounted, as conventional lighting tests are limited in detecting micro-cracks and cannot identify issues that arise post-mounting.
Innovation Solution
Incorporating a test circuit and switch configuration in the display panel that allows for the detection of internal cracks by using a lighting test signal and a reference signal, with the driving integrated circuit generating control signals to alternately supply these signals to the data lines, enabling crack detection both before and after mounting the driving integrated circuit.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If a conventional lighting test is used to detect internal cracks before mounting the driving integrated circuit, then early defects can be identified, but cracks that occur after mounting cannot be detected
Solution Approach 1:
The patent incorporates a test circuit and lighting test line into the display panel structure before the driving integrated circuit is mounted. This preliminary integration allows the test functionality to be prepared in advance, enabling crack detection both before and after mounting by using the existing data lines and pixel structures without requiring additional post-mounting modifications.
Solution Approach 2:
The lighting test line is integrated into the existing data line structure of the display panel, allowing the same physical infrastructure to serve dual purposes: normal data transmission during operation and crack detection during testing. The test circuit can operate in both pre-mounting and post-mounting scenarios, making the detection system universally applicable across different manufacturing stages.
2Measurement precision
If the display panel structure is modified to enable post-mounting crack detection, then detection capability is improved, but manufacturing process complexity increases
Solution Approach 1:
The patent merges the lighting test line with the existing data line structure of the display panel. Instead of creating separate dedicated test lines that would add complexity, the invention utilizes the already-present data lines and pixel structures for both normal operation and crack detection functions, thereby improving detection capability without significantly increasing manufacturing process complexity.
Solution Approach 2:
The display panel's existing pixels and data lines serve dual functions: they perform their normal display function during operation and simultaneously serve as the detection mechanism for crack testing. The test circuit leverages the panel's own structural elements (data lines, pixels) to detect cracks, eliminating the need for entirely separate detection infrastructure.
3Difficulty of detecting and measuring
If a lighting test signal is supplied through the non-display area, then cracks in the wiring can be detected, but micro-cracks may remain undetected
Solution Approach 1:
The patent applies different testing approaches to different areas of the display panel. The lighting test line is specifically routed through the non-display area where wiring cracks are most likely to occur, concentrating the detection capability where it is most needed. The test signal is supplied locally through this dedicated path, allowing detailed examination of the wiring in the non-display region without requiring full-panel illumination.
Applied Scientific Principles
This section explains which scientific principles are used to turn an abstract innovation direction into a practical engineering solution.
Function Achieved in This Case
This solution allows for the reliable detection of internal cracks and defects in the display panel, minimizing changes to the manufacturing process and ensuring panel integrity, even after the driving integrated circuit is mounted, by utilizing a lighting test line with varying resistance to indicate damage.
Implementation Method 1
a lighting test line extending through the portion of the non-display area and electrically connected to one pixel column at an outermost of the display via the data lines
Data Source
AI summary
A display panel includes: a display including pixel columns electrically connected to data lines; a non-display area adjacent the display; a test circuit configured to receive a lighting test signal passing through at least a portion of the non-display area and to transfer the lighting test signal to the data lines in response to a test control signal; and a switch configured to receive a data signal from an external component and to transfer the data signal to the data lines in response to a switching signal.