Display Panel Test Circuit Parallel Sub-Signal Lines
Find Innovative SolutionsGenerate Solutions
Solution Overview
Problem
Conventional OLED display panels exhibit uneven brightness in test screens due to excessive trace resistance in the wiring design, resulting in a brighter display in the middle and darker sides, which affects the test effect.
Innovation Solution
A display panel test circuit with a first signal line comprising a first sub-signal line, a second sub-signal line, and multiple third sub-signal lines, where the switching units are arranged to connect at least one third sub-signal line to the first sub-signal line between adjacent units, reducing total resistance and maintaining consistent voltage across the signal line, ensuring uniform brightness.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Device complexity
If the first signal line uses a simple wiring design, then the device complexity is reduced, but the trace resistance increases causing voltage dropping and uneven brightness
Solution Approach 1:
The first signal line is segmented into multiple parallel sub-signal lines (first sub-signal line, second sub-signal line, and multiple third sub-signal lines). This segmentation divides the current path into multiple channels, reducing the trace resistance in each individual line while maintaining the overall signal transmission function. The parallel configuration ensures that voltage dropping is minimized across the entire signal line structure.
Solution Approach 2:
The patent transitions from a single-dimensional signal line to a multi-dimensional parallel structure by introducing multiple sub-signal lines arranged in parallel. This dimensional change allows current to flow through multiple paths simultaneously, effectively reducing the equivalent resistance and improving voltage distribution uniformity across the display panel.
2Illumination intensity
If the first signal line is designed with multiple parallel sub-signal lines, then the voltage dropping is reduced and brightness uniformity is improved, but the device complexity increases
Solution Approach 1:
Multiple third sub-signal lines are merged with the first sub-signal line at specific connection points. This merging strategy combines the benefits of parallel low-resistance paths with the simplicity of a unified signal line structure. The connection points are strategically positioned to ensure uniform voltage distribution while avoiding excessive complexity in the wiring design.
Solution Approach 2:
The patent applies different wiring configurations to different regions of the signal line. The first and second sub-signal lines serve as main transmission paths, while the third sub-signal lines are locally introduced between switching units to provide additional current paths where needed. This localized optimization reduces resistance in critical areas without uniformly increasing complexity across the entire structure.
3Reliability
If the third sub-signal lines are connected at multiple points along the first sub-signal line, then the electrical conduct aivity is improved, but the manufacturing precision requirements increase
Solution Approach 1:
The connection points between the third sub-signal lines and the first sub-signal line are predetermined and pre-positioned during the design and manufacturing planning stage. These connection points are strategically located between switching units to optimize electrical conductivity while establishing clear manufacturing guidelines. By pre-defining the connection locations, the patent reduces the actual manufacturing precision requirements during production.
Data Source
AI summary
The display panel test circuit includes a first signal line, a first control line and a plurality of switching units, the first signal line comprises a first sub-signal line, a second sub-signal line and a plurality of third sub-signal lines, two ends of each of the third sub-signal lines are connected to the first sub-signal line and the second sub-signal line respectively. Each switching unit includes a first switching device, a control end thereof is connected to the first control line, an input end thereof is connected to the first sub-signal line, the output end of the first switching device is a test signal output end of the switching unit to which the first switching device belongs, and a portion of the first sub-signal line between any two adjacent switching units is connected to at least one third sub-signal line.