Display Panel Testing Apparatus Using FPGA and MCU Integration
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Solution Overview
Problem
Existing display panel testing apparatuses are complex, leading to long testing times and low detection efficiency due to the need for multiple wire connections, which can result in unreliable results.
Innovation Solution
A testing apparatus integrating a Field Programmable Gate Array (FPGA) chip and a Microcontroller Unit (MCU) chip to rapidly drive and analyze display panels, featuring modules for electrical and optical monitoring, power supply, and digital-to-analog conversion, reducing the complexity of the testing process.
Engineering Contradictions & Design Principles
Engineering Contradiction Analysis
1Measurement precision
If multiple wire connections are used to connect the testing apparatus to the display panel, then the testing apparatus can perform comprehensive electrical and optical measurements, but the operation process becomes complex and testing time increases
Solution Approach 1:
The patent integrates multiple monitoring functions (electrical monitoring, optical monitoring, power supply control) into a unified testing apparatus that connects to the display panel through a standardized interface. The control module coordinates all these functions through integrated control signals, reducing operational complexity while maintaining comprehensive measurement capabilities.
Solution Approach 2:
The testing apparatus is designed with multi-functional modules that can perform various measurements (electrical properties, optical properties, power consumption) through a single integrated system. The control module can selectively activate different monitoring functions based on testing requirements, simplifying the operation process while maintaining measurement comprehensiveness.
2Measurement precision
If multiple wire connections are used to connect the testing apparatus to the display panel, then comprehensive electrical and optical measurements can be performed, but testing time increases and detection efficiency decreases
Solution Approach 1:
The electrical monitoring module and optical monitoring module operate simultaneously and continuously during the testing process, collecting electrical properties, optical properties, and power consumption data in real-time without requiring sequential measurement steps. This parallel monitoring approach maintains comprehensive measurement capability while significantly reducing total testing time.
Solution Approach 2:
The testing apparatus pre-configures all monitoring channels and measurement parameters before actual testing begins. The control module prepares test patterns and monitoring thresholds in advance, allowing immediate commencement of comprehensive measurements without time-consuming setup procedures during production testing.
3Measurement precision
If multiple wire connections are used in the testing system, then various measurements can be taken, but the interface may be easily in poor contact leading to unreliable testing results
Solution Approach 1:
The patent combines multiple measurement functions (electrical, optical, power supply monitoring) into a single integrated testing apparatus that connects through one standardized interface. This consolidation reduces the number of separate connection points from multiple wires to a unified connection system, minimizing interface contact issues while maintaining all measurement capabilities.
4Measurement precision
If an existing detection apparatus for display is used, then the testing process can be performed, but the operation process is complex affecting detection efficiency
Solution Approach 1:
The control module automatically manages the testing process by selectively activating electrical monitoring, optical monitoring, and power supply modules based on pre-configured test parameters. The system performs self-diagnosis and adaptive measurement selection, reducing the need for complex manual operation while maintaining comprehensive display panel detection capability.
Data Source
AI summary
A testing apparatus and a testing method for a display panel. The testing apparatus includes a microcontroller unit (MCU) module; an electrical monitoring module, a power supply module, and a field programmable gate array (FPGA) module that are connected to the MCU module; a user interface (UI) display module; an optical monitoring module connected to the UI display module; and a gate driver on array (GOA) signal processing module and a digital-to-analog converter (DAC) module that are connected to the FPGA module. The power supply module, the GOA signal processing module, the DAC module, the electrical monitoring module, and the optical monitoring module are connected to a to-be-tested display panel.